Density Distribution Profiles of Excess Minority Carriers Injected with 904-nm-Wavelength Laser Pulse into 400-µm-Thick Silicon Wafer

Published 11 January 2005 Copyright (c) 2005 The Japan Society of Applied Physics
, , Citation Chusuke Munakata 2005 Jpn. J. Appl. Phys. 44 139 DOI 10.1143/JJAP.44.139

1347-4065/44/1R/139

Abstract

On numerically resolving the continuity equation for excess photocarriers, three-dimensional-type carrier distribution profiles in time and space have been obtained using a commercially available computer code. These pictures are useful for the quick understanding of the basic principle of the microwave-detected photoconductive decay method.

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10.1143/JJAP.44.139