Measurement of the Lifetime of Minority Carriers in Semiconductors with a Scanning Electron Microscope
Hisayuki Higuchi1 and Hifumi Tamura1
Copyright (c) 1965 The Japan Society of Applied Physics
,
,
Citation Hisayuki Higuchi and Hifumi Tamura 1965 Jpn. J. Appl. Phys. 4 316
DOI 10.1143/JJAP.4.316
Article metrics
52 Total downloads
Permissions
1347-4065/4/4/316