Measurement of the Lifetime of Minority Carriers in Semiconductors with a Scanning Electron Microscope

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Copyright (c) 1965 The Japan Society of Applied Physics
, , Citation Hisayuki Higuchi and Hifumi Tamura 1965 Jpn. J. Appl. Phys. 4 316 DOI 10.1143/JJAP.4.316

1347-4065/4/4/316

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