Current–Voltage Characteristics of Thin-Film Diode Elements and Application of Poole-Frenkel Equation

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Copyright (c) 1999 The Japan Society of Applied Physics
, , Citation Takanori Hirai et al 1999 Jpn. J. Appl. Phys. 38 6549 DOI 10.1143/JJAP.38.6549

1347-4065/38/11R/6549

Abstract

The current–voltage (IV) characteristics of a metal-insulator-metal type thin-film diode (TFD) could not be simply described by the Poole-Frenkel equation using the apparent thickness of the oxide film. If the effective thicknesses of the oxide film for the determination of terms α and β in the equation are appropriately estimated, the IV characteristics of the TFD element can be explained by the Poole-Frenkel equation. It was found that the optimum design parameters could easily be estimated by this new formula for a liquid-crystal display with the TFD element.

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10.1143/JJAP.38.6549