Production of Highly Charged Xe ions from the RIKEN 18 GHz Electron Cyclotron Resonance Ion Source using a Biased Electrode

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Copyright (c) 1998 The Japan Society of Applied Physics
, , Citation Takahide Nakagawa et al 1998 Jpn. J. Appl. Phys. 37 6215 DOI 10.1143/JJAP.37.6215

1347-4065/37/11R/6215

Abstract

We have observed the enhancement of Xe30,32+ ion beam intensity from the RIKEN 18 GHz electron cyclotron resonance ion source (ECRIS) using an electrode at bias voltage of ∼ -100 V. We have successfully obtained beam intensities of 11 eµA for the Xe30+ ion beam and 4 eµA for the Xe32+ ion beam using this method at an extraction voltage of 13 kV.

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10.1143/JJAP.37.6215