Abstract
In order to apply the dual-energy technique to material identification, a new computed tomography scanning system was proposed using a conventional X-ray tube and a CdTe detector. This system can provide information of projection data at two distinct energy bands for scanned materials. After introducing an approximation, the measured projection data were reconstructed to obtain the distributions of the X-ray linear attenuation coefficients of the materials at two different energies. Then, the corresponding atomic number and electron density can be derived with the dual-energy X-ray computed tomography (DXCT) method adopted. By comparing the obtained results with theoretical ones, the feasibility of using this system for identifying low-Z materials was demonstrated in this study.