Abstract
High-voltage 4H-SiC junction-barrier Schottky (JBS) diodes have been fabricated and studied. The working area of the diodes (anode contact area) is 1.44 mm2. At currents in the range from 10−11 to 1.5 A, the forward current-voltage characteristic of the diodes is described in terms of the thermionic emission model, with the series resistance taken into account: Schottky barrier height ΦB = 1.16 eV, ideality factor n = 1.01, and series resistance R s = 2.2 Ω (32 mΩ cm2). The value of R s is governed by the resistance of the blocking epitaxial n-base (impurity concentration N = 9 × 1014 cm−3, n-layer thickness d = 34 μm). The diodes can block a reverse voltage of at least 3.3 kV (with a leakage current at room temperature on the order of 1 μA). It is suggested that the leakage mechanism is associated with crystal lattice defects (dislocations) in SiC. It is shown that the reverse-recovery characteristics of the diodes are determined by the flow of a purely capacitive reverse current.
Similar content being viewed by others
References
A. Slabukhin, Komponent. Tekhnol., No. 2, 114 (2005).
A. Polishchuk, Silov. Elektron. No. 1, 34 (2006).
I. V. Grekhov, P. A. Ivanov, N. D. Il’inskaya, O. I. Kon’kov, A. S. Potapov, and T. P. Samsonova, Fiz. Tekh. Poluprovodn. 42, 211 (2008) [Semiconductors 42, 211 (2008)].
P. A. Ivanov, I. V. Grekhov, N. D. Il’inskaya, T. P. Samsonova, and A. S. Potapov, Fiz. Tekh. Poluprovodn. 43, 527 (2009) [Semiconductors 43, 505 (2009)].
P. A. Ivanov, I. V. Grekhov, A. S. Potapov, N. D. Il’inskaya, T. P. Samsonova, and O. I. Kon’kov, Fiz. Tekh. Poluprovodn. 43, 1249 (2009) [Semiconductors 43, 1209 (2009)].
I. V. Grekhov, P. A. Ivanov, A. S. Potapov, T. P. Samsonova, O. I. Kon’kov, and N. D. Il’inskaya, Patent RF No. 2390880 (Priority from May 25, 2009).
I. V. Grekhov, P. A. Ivanov, A. S. Potapov, T. P. Samsonova, O. I. Kon’kov, and N. D. Il’inskaya, Patent RF No. 2395868 (Priority from June 5, 2009).
G. Pensl, F. Ciobanu, and T. Frank, Int. J. High. Speed Electron. Syst. 15, 705 (2005).
P. A. Ivanov, I. V. Grekhov, A. S. Potapov, T. P. Samsonova, N. D. Il’inskaya, O. I. Kon’kov, and O. Yu. Serebrennikova, Fiz. Tekh. Poluprovodn. 44, 680 (2010) [Semiconductors 44, 653 (2010)].
Q. Wahab, A. Ellison, A. Henry, E. Janzen, C. Hallin, J. Di Persio, and R. Martinez, Appl. Phys. Lett. 76, 2725 (2000).
B. Hull, J. Sumakeris, M. O’Loughlin, J. Zhang, J. Richmond, A. Powell, M. Paisley, V. Tsvetkov, A. Hefner, and A. Rivera, Mater. Sci. Forum 600–603, 931 (2009).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © P.A. Ivanov, I.V. Grekhov, N.D. Il’inskaya, O.I. Kon’kov, A.S. Potapov, T.P. Samsonova, O.U. Serebrennikova, 2011, published in Fizika i Tekhnika Poluprovodnikov, 2011, Vol. 45, No. 5, pp. 677–681.
Rights and permissions
About this article
Cite this article
Ivanov, P.A., Grekhov, I.V., Il’inskaya, N.D. et al. High-voltage (3.3 kV) 4H-SiC JBS diodes. Semiconductors 45, 668–672 (2011). https://doi.org/10.1134/S1063782611050125
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063782611050125