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High-voltage (3.3 kV) 4H-SiC JBS diodes

  • Physics of Semiconductor Devices
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Abstract

High-voltage 4H-SiC junction-barrier Schottky (JBS) diodes have been fabricated and studied. The working area of the diodes (anode contact area) is 1.44 mm2. At currents in the range from 10−11 to 1.5 A, the forward current-voltage characteristic of the diodes is described in terms of the thermionic emission model, with the series resistance taken into account: Schottky barrier height ΦB = 1.16 eV, ideality factor n = 1.01, and series resistance R s = 2.2 Ω (32 mΩ cm2). The value of R s is governed by the resistance of the blocking epitaxial n-base (impurity concentration N = 9 × 1014 cm−3, n-layer thickness d = 34 μm). The diodes can block a reverse voltage of at least 3.3 kV (with a leakage current at room temperature on the order of 1 μA). It is suggested that the leakage mechanism is associated with crystal lattice defects (dislocations) in SiC. It is shown that the reverse-recovery characteristics of the diodes are determined by the flow of a purely capacitive reverse current.

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Correspondence to P. A. Ivanov.

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Original Russian Text © P.A. Ivanov, I.V. Grekhov, N.D. Il’inskaya, O.I. Kon’kov, A.S. Potapov, T.P. Samsonova, O.U. Serebrennikova, 2011, published in Fizika i Tekhnika Poluprovodnikov, 2011, Vol. 45, No. 5, pp. 677–681.

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Ivanov, P.A., Grekhov, I.V., Il’inskaya, N.D. et al. High-voltage (3.3 kV) 4H-SiC JBS diodes. Semiconductors 45, 668–672 (2011). https://doi.org/10.1134/S1063782611050125

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