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Optical and Photoluminescent Properties of Thin-Film ZnO–PLZT Structure in the UV and Visible Spectral Regions

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Abstract

The structural, optical, and photoluminescent properties of the thin-film structure ZnO–PLZT ferroelectric ceramics are studied. The results of X-ray diffraction analysis for a zinc oxide film synthesized on PLZT and quartz substrates are reported. The transmission, reflection, absorption, and photoluminescence spectra of thin-film ZnO–LPZT and ZnO–SiO2 structures in the UV and visible spectral regions are presented.

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Authors and Affiliations

  1. ITMO University, 197101, St. Petersburg, Russia

    L. V. Grigor’ev, Ya. B. Egorova & N. A. Bykov

  2. St. Petersburg Electrotechnical University LETI, 197022, St. Petersburg, Russia

    L. V. Grigor’ev, A. A. Semenov & A. A. Nikitin

Authors
  1. L. V. Grigor’ev
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  2. Ya. B. Egorova
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  3. N. A. Bykov
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  4. A. A. Semenov
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  5. A. A. Nikitin
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Correspondence to L. V. Grigor’ev.

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Translated by M. Basieva

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Grigor’ev, L.V., Egorova, Y.B., Bykov, N.A. et al. Optical and Photoluminescent Properties of Thin-Film ZnO–PLZT Structure in the UV and Visible Spectral Regions. Opt. Spectrosc. 127, 1080–1084 (2019). https://doi.org/10.1134/S0030400X19120075

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  • DOI: https://doi.org/10.1134/S0030400X19120075

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