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Reflection electron-energy-loss spectroscopy of Fe x Si1 − x thin films

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Abstract

The values of the product of the inelastic mean free path and the differential cross section for inelastic scattering of electrons have been determined from the reflection electron-energy-loss spectra of thin films of the Fe x Si1 − x system (0 ≤ x ≤ 1). A new approach to the quantitative analysis of components in such composite media is proposed.

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Authors and Affiliations

  1. Siberian State Aerospace University, Krasnoyarsk, 660014, Russia

    A. S. Parshin, G. A. Alexandrova, A. E. Dolbak, O. P. Pchelyakov, B. Z. Ol’shanetskiĭ, S. G. Ovchinnikov & S. A. Kushchenkov

  2. Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, 630090, Russia

    A. S. Parshin, G. A. Alexandrova, A. E. Dolbak, O. P. Pchelyakov, B. Z. Ol’shanetskiĭ, S. G. Ovchinnikov & S. A. Kushchenkov

  3. Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russia

    A. S. Parshin, G. A. Alexandrova, A. E. Dolbak, O. P. Pchelyakov, B. Z. Ol’shanetskiĭ, S. G. Ovchinnikov & S. A. Kushchenkov

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  1. A. S. Parshin
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  2. G. A. Alexandrova
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  3. A. E. Dolbak
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  4. O. P. Pchelyakov
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  5. B. Z. Ol’shanetskiĭ
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  6. S. G. Ovchinnikov
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  7. S. A. Kushchenkov
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Additional information

Original Russian Text © A.S. Parshin, G.A. Alexandrova, A.E. Dolbak, O.P. Pchelyakov, B.Z. Ol’shanetskiĭ, S.G. Ovchinnikov, S.A. Kushchenkov, 2008, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2008, Vol. 34, No. 9, pp. 41–48.

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Parshin, A.S., Alexandrova, G.A., Dolbak, A.E. et al. Reflection electron-energy-loss spectroscopy of Fe x Si1 − x thin films. Tech. Phys. Lett. 34, 381–383 (2008). https://doi.org/10.1134/S1063785008050064

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  • DOI: https://doi.org/10.1134/S1063785008050064

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