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The Magneto-Optical Voigt Parameter from Magneto-Optical Ellipsometry Data for Multilayer Samples with Single Ferromagnetic Layer

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Abstract

Calculations of the magneto-optical Voigt parameter Q were carried out using various models of reflecting media for thin films Fe|SiO2|Si(100) samples using the data of the in situ magneto-ellipsometry. The obtained spectral dependences of Q make it possible to choose the algorithm for the analysis of experimental magneto-ellipsometry data and demonstrate that magneto-optical parameter Q of iron is thickness-dependent.

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ACKNOWLEDGMENTS

We thank the Krasnoyarsk Regional Center of Research Equipment of Federal Research Center “Krasnoyarsk Science Center SB RAS” for the opportunity to record X-ray photoelectron spectra using a SPECS photoelectron spectrometer (http://ccu.kirensky.ru/info/19/).

Funding

The research was supported by the government of the Russian Federation (agreement no. 075-15-2019-1886).

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Authors and Affiliations

  1. Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russia

    O. Maximova, S. Lyaschenko, I. Tarasov, I. Yakovlev, S. Varnakov & S. Ovchinnikov

  2. Siberian Federal University, Krasnoyarsk, Russia

    O. Maximova & S. Ovchinnikov

  3. Institute of Chemistry and Chemical Technology, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russia

    Y. Mikhlin

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  1. O. Maximova
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Correspondence to O. Maximova.

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APPENDIX

APPENDIX

For sample 4, additional studies were carried out using X-ray photoelectron spectroscopy (XPS) with layer-by-layer etching of the sample with argon ions (Fig. 11) to obtain information on the structure and elemental composition of the sample.

Fig. 11.
figure 11

(a) X-ray photoelectron spectra and (b) atomic content in the surface layer of sample 4.

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X-ray photoelectron spectra were recorded using a SPECS photoelectron spectrometer with a PHOIBOS 150 MCD 9 hemispherical energy analyzer under excitation by MgKα (1253.6 eV) radiation from the magnesium anode of the X-ray tube and the normal angle of photoelectron registration. The transmission energies of the energy analyzer were 20 eV for survey spectra and 8 eV for high-resolution spectra. To obtain a depth profile of elements, a PU-IQE 12/38 (SPECS) argon ion source was used, the argon ion energy was 2.6 keV, and the ion current was 60 μA. The spectra were processed with the CasaXPS software package.

The Fe2p spectra show the presence of metallic iron with a binding energy of ~706.8 eV and, probably, several oxide phases that contain Fe3+ and Fe2+ after removal of the strongly oxidized surface layer by ion etching. The total proportion of elemental iron in the spectra increases with etching time from ~20 to ~50%. The occurrence of significant quantities of carbon and oxygen on the film surface is caused by exposure of the sample to the atmosphere during transfer to the XPS spectrometer. Taking into account the ex situ oxidation, the atomic concentration of iron is consistent with the data on thickness measurements by XRF.

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Maximova, O., Lyaschenko, S., Tarasov, I. et al. The Magneto-Optical Voigt Parameter from Magneto-Optical Ellipsometry Data for Multilayer Samples with Single Ferromagnetic Layer. Phys. Solid State 63, 1485–1495 (2021). https://doi.org/10.1134/S1063783421090274

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