Abstract
A criterion for estimating the homogeneity of materials for refractive X-ray optics from small-angle X-ray scattering data is proposed. A material of new type—nanoberyllium—is considered. A number of samples of beryllium materials, including commercial products, have been analyzed. The X-ray homogeneity of the materials is determined, as well as the influence of technological processes.
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ACKNOWLEDGMENTS
The study was supported by the Federal Agency for Scientific Organizations (contract no. 007-ГЗ/Ч3363/26) in the part concerning the development and application of methods for diagnostics of materials using X rays and synchrotron radiation. Small-angle X-ray scattering studies were performed using equipment of the Shared Research Center of the Shubnikov Institute of Crystallography, Russian Academy of Sciences, with support of the Ministry of Education and Science of the Russian Federation. X-ray transmission spectra were recorded at the Structural Materials Science station of the Kurchatov Synchrotron Radiation Source.
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Semenov, A.A., Volkov, V.V., Zabrodin, A.V. et al. A Study of Beryllium-Based Materials and Comparison of Their X-Ray Homogeneities According to Small-Angle Scattering Data. Crystallogr. Rep. 63, 874–882 (2018). https://doi.org/10.1134/S1063774518060275
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DOI: https://doi.org/10.1134/S1063774518060275