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X-ray diffraction study of the crystallographic characteristics of TlInS x Se2 − x solid solutions

  • Structure of Inorganic Compounds
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Abstract

Crystallographic parameters of TlInS x Se2 − x solid solutions have been measured by X-ray diffraction. Dependences of the unit-cell parameters on the composition are determined. It is established that the values of parameters a, b, and c and the angle β decrease with an increase in x. It is shown that the TlInS x Se2 − x system includes a continuous series of solid solutions based on the TlInSe2 compound with tetragonal symmetry at x values ≤ 0.4, while at x ≥ 0.6 solid solutions based on the TlInS2 compound with a monoclinic structure are formed.

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Authors and Affiliations

  1. Scientific-Practical Materials Research Centre of the National Academy of Sciences of Belarus, Minsk, Belarus

    A. U. Sheleg, V. G. Hurtavy & V. V. Shautsova

  2. Institute of Physics, Academy of Sciences of Azerbaijan, Baku, Az-1143, Azerbaijan

    V. A. Aliev

Authors
  1. A. U. Sheleg
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  2. V. G. Hurtavy
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  3. V. V. Shautsova
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  4. V. A. Aliev
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Correspondence to A. U. Sheleg.

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Original Russian Text © A.U. Sheleg, V.G. Hurtavy, V.V. Shautsova, V.A. Aliev, 2014, published in Kristallografiya, 2014, Vol. 59, No. 2, pp. 231–234.

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Sheleg, A.U., Hurtavy, V.G., Shautsova, V.V. et al. X-ray diffraction study of the crystallographic characteristics of TlInS x Se2 − x solid solutions. Crystallogr. Rep. 59, 186–189 (2014). https://doi.org/10.1134/S1063774514020229

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  • DOI: https://doi.org/10.1134/S1063774514020229

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