Abstract
The overwhelming majority of modern nanotechnologies deal with nanoparticles owing to the great variety of their unusual properties, which make them irreplaceable in various fields of science and technology. Since the physical properties of nanoparticles depend on their composition, structure, and shape, the problem of monitoring these parameters both after and during formation of nanoparticles is very important. Methods of electron crystallography are most informative and appropriate for studying and monitoring nanoparticle parameters. In this review, we briefly report the main modern methods based on the use of electron diffraction and electron microscopy, along with examples of their applications for nanoparticles, to solve a number of urgent structural problems of nanomaterials science.
Similar content being viewed by others
References
L. J. de Jongh, Physics and Chemistry of Metal Cluster Compounds (Kluwer, Dordrecht, 1994).
G. Schmid, Clusters and Colloids from Theory of Applications (VCH, Weinheim, 1994).
Nanoparrticles and Nanostructured Films, Ed. by J. H. Fendler (VCH, Weinheim, 1998).
T. Sugimoto, Fine Particles: Synthesis, Characterizations and Mechanisms of Growth (Marcel Dekker, New York, 2000).
L. M. Liz-Marzan and P. V. Kamat, Nanoscale Materials (Kluwer, Boston; MA, 2003).
N. Toshima, Encyclopedia of Nanoscience and Nanotechnology, Ed. by J. A. Scwarz et al. (Marcel Dekker, New York, 2004), p. 1869.
Metal Nanoparticles: Synthesis, Preparation Control Technology, and Applications, Ed. by T. Yonezawa (Gijutsu Joho Kyokai, Tokyo, 2004).
C. B. Murray, D. J. Norris, and M. G. Bawendi, J. Am. Chem. Soc. 115, 8706 (1993).
A. L. Efros, Sov. Phys. Semicond. 16, 772 (1982).
W. P. Halperin, Rev. Mod. Phys. 58, 533 (1986); A. P. Alivisatos, Science 271, 933 (1996).
M. L. Steigerwald, A. P. Alivisatos, J. M. Gibson, et al., J. Am. Chem. Soc. 110, 3046 (1988).
V. L. Colvin, A. N. Goldstein, and A. P. Alivisatos, J. Am. Chem. Soc. 114, 5221 (1992).
M. A. Olshavsky, A. N. Goldstein, and A. P. Alivisatos, J. Am. Chem. Soc. 112, 9438 (1990).
C. F. Landes, S. Link, M. B. Mohamed, et al., Pure. Appl. Chem. 74, 1675 (2002); X. Peng, L. Manna, W. Yang, et al., Nature 404, 59 (2000).
S. P. Gubin, G. Yu. Yurkov, and N. A. Kataeva, Noble-Metal Nanoparticles and Materials on Their Basis (Azbuka, Moscow, 2006) [in Russian].
C. J. Murphy, T. K. Sau, A. M. Gole, et al., J. Phys. Chem. B 109, 13857 (2005).
T. Kijima, T. Yoshimura, M. Uota, et al., Angew. Chem. Int. Ed. 43, 228 (2004).
Y. Gao, P. Jiang, D. F. Liu, et al., Chem. Phys. Lett. 380, 146 (2003).
Q. Ma, E. F. Remsen, T. Kowalewski, et al., J. Am. Chem. Soc. 123, 4627 (2001).
J. F. Hicks, S. Young, and R. W. Murray, Langmuir 18, 2288 (2002).
H. X. He, H. Zhang, Q. G. Li, et al., Langmuir 16, 3846 (2000).
B. Kim, S. T. Tripp, and A. Wei, J. Am. Chem. Soc. 123, 7955 (2001).
M. Giersig and P. Mulvaney, J. Phys. Chem. 97, 6334 (1993).
T. Maddanimath, A. Kumar, J. D’Arcy-Gall, et al., Chem. Commun. 1435 (2005).
C. Gammer, C. Mangler, C. Rentenberger, et al., Scr. Mater. 63, 312 (2010).
L. U. Qianghua, Y. A. O. Kailun, X. I. Dong, et al., J. Mater. Sci. Technol. 23(2), 189 (2007).
C. W. B. Grigson, Rev. Sci. Instrum. 36, 1587 (1965).
P. N. Denbigh and D. V. Dove, J. Appl. Phys. 38(1), 99 (1967).
R. B. Neder et al., Phys. Status Solidi C 4, 3221 (2007).
R. B. Neder et al., J. Phys.: Condens. Matter 17, S125 (2005).
M. Malac, F. Wang, R. Egerton, et al., Microsc. Microanal. 13(Suppl. 2), 558CD (2007).
C. Dwyer, A. I. Kirkland, P. Hartel, et al., Appl. Phys. Lett. 90, 151104 (2007).
J. M. Cowley, Microsc. Res. Tech. 46(2), 75 (1999); Electron Microsc. 45, 3 (1996).
J. M. Cowley, Ultramicroscopy 90(2), 197 (2002).
D. Alloyeaua, C. Ricolleaua, T. Oikawa, et al., Ultramicroscopy 108, 656 (2008).
M. J. Behr, K. A. Mkhoyan, and E. S. Aydil, Carbon 48, 3840 (2010).
Z. H. Yu, M. A. Hahn, S. E. Maccagnano-Zacher, et al., ACS Nano 2(6), 1179 (2008).
R. V. Petrova, R. R. Vanfleet, D. R. Richardson, et al., Microsc. Microanal. 11(Suppl. 2), 782 (2005).
R. Vincent and P. A. Midgley, Ultramicroscopy 53, 271 (1994).
C. S. Own, W. Sinkler, and L. D. Marks, Ultramicroscopy 107, 534 (2007).
A. P. Dudka, A. S. Avilov, and S. Nikolopoulos, Ultramicroscopy 107, 474 (2007).
A. Avilov, K. Kuligin, S. Nicolopoulos, et al., Ultramicroscopy 107, 431 (2007).
E. Mugnaioli, I. Andrusenko, T. Schuler, et al., Angew. Chem. Int. Ed. 51, 7041 (2012).
E. Mugnaioli, S. J. Sedlmaier, O. Oeckler, et al., Eur. J. Inorg. Chem. 121 (2012).
I. Rozhdestvenskaya, E. Mugnaioli, M. Czank, et al., Mineral. Mag. 74(1), 159 (2010).
G. Bellussi, E. Montanari, E. Di Paola, et al., Angew. Chem. Int. Ed. 51, 666 (2012).
E. Sarakinou, E. Mugnaioli, Ch. B. Lioutas, et al., Semicond. Sci. Technol. 27, 105003 (2012).
I. Andrusenko, E. Mugnaioli, T. E. Gorelik, et al., Acta Crystallogr. B 67, 218 (2011).
E. Barborini, C. Ducati, M. Leccardi, et al., Jpn. J. Appl. Phys. 50, 01AK01 (2011).
B. Cao, T. Xi, and D. Hui, Metalurgija-MJoM 17(2), 79 (2011).
R. R. Keller and R. H. Geiss, J. Microsc. 245, 245 (2012).
B. K. Vainshtein, Structural Electron Diffraction (Izdvo Akad. Nauk SSSR, Moscow, 1956) [in Russian].
U. Kolb, E. Mugnaioli, and T. E. Gorelik, Cryst. Res. Technol. 6, 542 (2011).
J. R. Jinschek et al., Ultramicroscopy 108, 589 (2008).
I. Arslan, J. C. Walmsley, E. Rytter, et al., J. Am. Chem. Soc. 130, 5716 (2008); L. Cervera Gontard, R. E. Dunin-Borkowski, R. K. K. Chong, et al., J. Phys.: Conf. Ser. 26, 203 (2006).
A. B. Hungrídotless, B. H. Juárez, C. Klinke, et al., Nano Res. 1, 89 (2008); Y. Liang, Y. Wu, S.-T. Feng, et al., J. Am. Chem. Soc. 131, 56S (2008); Z. Aghi, D. J. Holland, R. Leary, et al., Nano Lett. 11, 4666 (2011).
L. C. Gontard, R. E. Dunin-Borkowski, M. H. Gass, et al., J. Electron Microsc. 58(3), 167 (2009).
V. H. Mareau et al., Macromolecules 40(25), 9032 (2007).
K. Gries, R. Kröger, C. Kübel, et al., Acta Biomater. 5(8), 3038 (2009).
M. C. Scott, Ch.-Ch. Chen, M. Mecklenburg, et al., Nature 483, 444 (2012).
Z. Saghi and P. A. Midgley, Ann. Rev. Mater. Res. 42, 59 (2012).
P. A. Midgley, E. P. W. Ward, A. B. Hungria, et al., Chem. Soc. Rev. 36, 1477 (2007).
S. van Aert, K. J. Batenburg, M. D. Rossell, et al., Nature 470, 374 (2011).
D. Gabor, Nature 4098, 777 (1948).
J. M. Cowley, Ultramicroscopy 41, 335 (1992).
H. Lichte, D. Geiger, and M. Linck, Philos. Trans. R. Soc. 367(1903), 3773 (2009).
M. Gajdardziska-Josifovska et al., Ultramicroscopy 50, 285 (1993); J. Cai and F. A. Ponce, Phys. Status Solidi 192, 407 (2002).
M. Stevens, F. A. Ponce, et al., Appl. Phys. Lett. 85, 4651 (2004).
K. Yamamoto, S. A. Majetich, M. Sachan, et al., Microsc. Microanal. 13(Suppl. 2), 1218 CD (2007); L. T. Kuhn, R. J. Harrison, T. Kasama, et al., Proc. IMC16, Sapporo, 2006; M. Nakanishi et al., Mater. Trans. 48 (10), 2599 (2007); R. E. Dunin-Borkovski, T. Kasama, et al., Microsc. Res. Tech. 64, 390 (2004); L. Li, D. J. Smith, E. Dailey, et al., Nano Lett. 11, 493 (2011).
K. K. Koziol, T. Kasama, R. E. Dunin-Borkowski, et al., Mater. Res. Soc. Symp. Proc. 962, 0962–P13-03 (2007).
L. Li, D. J. Smith, E. Dailey, et al., Nano Lett. 11, 493 (2011).
R. Popescu, E. Müller, M. Wanner, et al., Phys. Rev. B 76, 235411 (2007).
J. Cumings, A. Zett, McCartney, et al., Phys. Rev. Lett. 88(5), 056804-1 (2002).
Y. Gao, D. Shindo, Y. Bao, et al., Appl. Phys. Lett. 90, 233105-1 (2007).
J. M. Zuo, I. Vartanyants, M. Gao, et al., Science 300, 1419 (2004).
R. W. Gerchberg and W. O. Saxton, Optik 35, 237 (1972).
J. Miao, P. Charalambous, J. Kirz, et al., Nature 15, 342 (1999).
D. Sayre, Acta Crystallogr. A 5, 843 (1952).
J. Fienup, Appl. Opt. 21, 2758 (1982).
W. J. Huang, J. M. Zuo, B. Jiang, et al., Nature Phys. 5, 129 (2009).
A. A. Ischenko, V. V. Golubkov, V. P. Spiridonov, et al., Appl. Phys. B 32, 161 (1983); A. P. Rood and J. Milledge, J. Chem. Soc. Faraday Trans. 2, 1145 (1984); J. D. Ewbank, L. Schafer, and A. A. Ischenko, J. Mol. Struct. 534, 1 (2000).
A. H. Zewail, Ann. Rev. Phys. Chem. 57, 65 (2006).
A. A. Ishchenko, V. N. Bagratashvili, and A. S. Avilov, Crystallogr. Rep. 56(5), 751 (2011).
A. H. Zewail and J. M. Thomas, 4D Electron Microscopy (Imperial College, 2010); S. J. L. Billinge and L. Levine, Science 316, 560 (2007).
V. A. Lobastov, R. Srinivasan, F. Vigliotti, et al., UltraFast Optics IV. Springer Series in Optical Sciences, Ed. by F. Krausz et al. (Springer, Berlin, 2003), p. 413; J. M. Thomas, Angew. Chem. Int. Ed. 43, 2606 (2004).
C.-Y. Ruan, Y. Murooka, R. K. Raman, et al., Microsc. Microanal. 15, 323 (2009).
R. K. Raman, Y. Murooka, C.-Y. Ruan, et al., Phys. Rev. Lett. 101, 077401 (2008).
C.-Y. Ruan, Y. Murooka, R. K. Raman, et al., Nano Lett. 7(5), 1290 (2007); Phys. Rev. Lett. 101, 077401 (2008).
T. LaGrange, G. H. Campbell, P. E. A. Turchi, et al., Acta Mater. 55, 5211 (2007).
N. A. Anderson and T. Lian, An. Rev. Phys. Chem. 56, 491 (2005); R. A. Murdick, R. K. Raman, Y. Murooka, et al., Phys. Rev. B 77, 24532991 (2007); C.-Y. Ruan, Y. Murooka, R. K. Raman, et al., Microsc. Microanal. 15, 323 (2009).
W. Wang, T. Lee, and M. A. Reed, Rep. Prog. Phys. 68, 523 (2005).
R. K. Raman, R. A. Murdick, F. J. Worhatch, et al., Phys. Rev. Lett. 104, 123401 (2010).
J. Kanasaki, E. Inami, K. Tanimura, et al., Phys. Rev. Lett. 102, 087402 (2009).
P. Baum and A. H. Zewail, Proc. Natl. Acad. Sci. USA 104, 18409 (2007).
F. Hubert, F. Testard, G. Rizza, et al., Langmuir 26(10), 6887 (2010); K. Simeonidis, S. Mourdikoudis, A. Vilalta-Clemente, et al., Proc. Phys. Adv. Mater. Winter School, 2008); J. Yang, L. Levina, E. H. Sargent, et al., J. Mater. Chem. 16, 4025 (2006); S. Sepulveda-Guzman, N. Elizondo-Villarreal, D. Ferrer, et al., Nanotechnology 18, 335604 (2007).
Analytical Electron Microscopy of Gold Nanoparticles on Ceria, Titania, and Ceria-Titania Materials, Ed. by A. C. Sónia et al. (FORMATEX, 2010). p. 1830.
H. Kumarakuru, D. Cherns, M. G. Montes de Oca, et al., J. Phys: Conf. Ser. 371, 012025 (2012).
P. Billaud, S. Marhaba, E. Cottancin, et al., J. Phys. Chem. C 112, 978 (2008).
S. Kang, S. Shi, Zh. Jia, et al., Appl. Phys. 101, 09J113 (2007).
D. K. Dwivedi, Dayashankar, and M. Dubey, J. Ovonic Res. 6(1), 57 (2010).
M. A. Olson, A. Coskun, R. Klajn, et al., Nano Lett. 9(9), 3185 (2009).
V. L. Gayou, B. S. Hernandez, R. D. Macuil, et al., J. Nano Res. 9, 125 (2010); R. D. Tilley, Chem. New Zealand, 146 (2008).
N. Pugazhenthiran, S. Anandan, G. Kathiravan, et al., J. Nanopart. Res. 11, 1811 (2009); M. G. Guzman, J. Dille, and S. Godt, World Acad. Sci. Eng. Technol. 43, 357 (2008).
S. M. Moldovan, H. Bulou, Y. J. Dappe, et al., J. Phys. Chem. C 116(16), 9274 (2012).
P. Moravec, J. Smolík, H. Keskinen, et al., Mater. Sci. Appl. 2, 258 (2011); S. Singh and S. B. Krupanidhi, Curr. Nanosci. 5, 489 (2009); Q. Zhang, J. Xie, J. Y. Lee, et al., 4 (8), 1067 (2008); Q. Zhang, J. Y. Lee, J. Yang, et al., Nanotechnology 18, 245605 (2007); D. S. Jacob, I. Genish, L. Klein, et al., J. Phys. Chem. Lett. B 110 (36), 17711 (2006).
S. Asahina, S. Takami, T. Otsuka, et al., Chem. Cat. Chem. Special Issue: Adv. Microsc. 3(6), 1038 (2011).
J. Tang, Z. Li, Q. Xia, and R. S. Williams, Langmuir Lett. 25(13), 7222 (2009).
H. Yao and K. Kimura, Modern Research and Educational Topics in Microscopy, Ed. by A. Méndez-Vilas and J. Díaz (FORMATEX, 2007), p. 568.
R. J. Barsotti, M. D. Vahey, R. Wartena, et al., 3(3), 488 (2007).
N. Ghinwa, H. Sabahudin, M. Keith, et al., J. Microsc. Res. Tech. 71(10), 742 (2008).
C. C. Berry, S. Wells, S. Charles, et al., Biomaterials 24(250, 4551 (2003).
K. L. Bunker, J. L. Sturgeon, T. L. Lersch, et al., Microsc. Microanal. 16, 668 (2010).
S. J. Pennycook, Ultramicroscopy 30, 58 (1989).
X. F. Xhang, Microsc. Today 19(5), 26 (2011).
I. Florea, A. Demortuire, C. Petit, et al., Nanoscale 4, 5125 (2012).
L. C. Gontard, R. E. Dunin-Borkowski, M. H. Gass, et al., J. Electron Microsc. 58(3), 167 (2009).
D. Wang, H. L. Xin, R. Hovden, et al., Nature Mater. 12, 81 (2013).
S. van Aert, A. de Backer, G. T. Martinez, et al., (APS) Phys. Rev. B 8(6), 064107 (2013).
M. Ryvolova, J. Chomoucka, J. Drbohlavova, et al., Sensors. 12, 14792 (2012).
A. Ponce, S. Mejna-Rosales, and M. Jos-Yacam, Methods Mol. Biol. 906, 453 (2012).
M. Sankar, N. Dimitratos, P. J. Miedziak, et al., J. Chem. Soc. Rev. 41, 8099 (2012).
J. C. Yang, M. W. Small, R. V. Grieshaber, et al., Chem. Soc. Rev. 41, 8179 (2012).
B. G. Mendis and A. J. Craven, Ultramicroscopy 111(3), 212 (2009).
A. L. Koh, K. Bao, I. Khan, et al., ACS Nano 3(10), 3015 (2009).
J. Nelayah, M. U. Kociak, O. Strephan, et al., Nature Phys. 3, 348 (2007).
He, Y. Liu, J. Liu, et al., Angew. Chem. Int. Ed. 52, 1 (2013).
He, P. D. Nellist, S. Lozano-Perez, et al., J. Phys.: Conf. Ser. 371, 012027 (2012).
R. Leary, Z. Saghi, M. Armbrüster, et al. J. Phys: Conf. Ser. 371, 012024 (2012).
F. L. Deepak, G. Casillas-Garcia, R. Esparza, et al., J. Cryst Growth 325(1), 60 (2011).
L. Gan, R. Yu, J. Luo, et al., J. Phys. Chem. Lett. 3(7), 934 (2012).
P. Y. Huang, C. S. Ruiz-Vargas, A. M. van der Zande, et al., Nature 469, 389 (2011).
L. Dong, J. Hansen, P. Xu, et al., Appl. Phys. Lett. 101, 061601 (2012).
M. S. Moldovan, H. Bulou, Y. J. Dappe, et al., J. Phys. Chem. 116(16), 9274 (2012).
O. Cretu, J. A. Rodrnguez-Manzo, A. Demorti, et al., Carbon 50(1), 259 (2012).
A. B. Hungría, B. H. Juárez, C. Klinke, et al., Nano Res. 1, 89 (2008).
U. M. Bhatta, I. M. Ross, Z. Saghi, et al., J. Phys.: Conf. Ser. 371, 012007 (2012).
M. Delalande, M. J.-F. Guinel, L. F. Allard, et al., J. Phys. Chem. 116, 6866 (2012).
T. Akita, K. Tanaka, M. Kohyamaa, et al., Surf. Interface Anal. 40, 1760 (2008).
M. A. Asoro, D. Kovar, Y. Shao-Horn, et al., Nanotechnology 21, 025701-1 (2010).
K. van Benthem, A. R. Lupini, M. Kim, et al., Appl. Phys. Lett. 87, 034104 (2005); A. Y. Borisevich, A. R. Lupini, and S. J. Pennycook, Proc. Natl. Acad. Sci. USA 103, 3044 (2006); A. Hashimoto, P. Wang, M. Shimojo, et al., Appl. Phys. Lett. 101, 253108 (2012).
P. Wang, G. Behan, M. Takeguchi, et al., Phys. Rev. Lett. 104, 200801 (2010).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © A.S. Avilov, S.P. Gubin, M.A. Zaporozhets, 2013, published in Kristallografiya, 2013, Vol. 58, No. 6, pp. 785–803.
On the 70th Anniversary of the Shubnikov Institute of Crystallography of the Russian Academy of Sciences
Rights and permissions
About this article
Cite this article
Avilov, A.S., Gubin, S.P. & Zaporozhets, M.A. Electron crystallography as an informative method for studying the structure of nanoparticles. Crystallogr. Rep. 58, 788–804 (2013). https://doi.org/10.1134/S1063774513060059
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063774513060059