Abstract—
Resistive switching in thin (5–10 nm) ZrO2(Y) films with Au nanoparticles is studied via tunneling atomic force microscopy. Regions of negative differential resistance are observed in the current–voltage curves of individual filaments formed under the probe potential. Their emergence is attributed to resonant electron tunneling through size-quantized electronic states with a discrete energy spectrum in Au nanoparticles embedded in the filaments.
Similar content being viewed by others
REFERENCES
J. Ouyang, Emerging Resistive Switching Memories (Springer, Berlin, Heidelberg, 2016).
Resistive Switching: From Fundamentals of Nanoionic Redox Processes to Memristive Device Applications, Ed. by D. Ielmini and R. Waser (Wiley-VCH, Stuttgart, 2016).
R. Waser, R. Dittmann, G. Staikov, et al., Adv. Mater. 21, 2632 (2009). https://doi.org/10.1002/adma.200900375
Conductive Atomic Force Microscopy: Applications in Nanomaterials, Ed. by M. Lanza (Wiley-VCH, Stuttgart, 2017).
M. Lanza, Materials 7 (3), 2155 (2014). https://doi.org/10.3390/ma7032155
D. S. Jeong, R. Thomas, R. S. Katiyar, et al., Rep. Prog. Phys. 75 (7), 076 502 (2012). https://doi.org/10.1088/0034-4885/75/7/076502
D. Filatov, D. Antonov, I. Antonov, et al., J. Mater. Sci. Chem. Eng. 5, 8 (2017). https://doi.org/10.4236/msce.2017.51002
W. Guan, S. Long, R. Jia, et al., Appl. Phys. Lett. 91 (6), 062 111 (2007). https://doi.org/10.1063/1.2760156
S. H. Cho, S. Lee, D. Y. Ku, et al., Thin Solid Films 447–448, 68 (2004). https://doi.org/10.1016/j.tsf.2003.09.024
O. Gorshkov, I. Antonov, D. Filatov, et al., Adv. Mater. Sci. Eng. 2017, 1 759 469 (2017). https://doi.org/10.1155/2017/1759469
O. N. Gorshkov, I. N. Antonov, D. O. Filatov, et al., Tech. Phys. Lett. 42 (1), 36 (2016). https://doi.org/10.1134/S1063785016010089
M. A. Lapshina, D. O. Filatov, and D. A. Antonov, J. Surf. Invest.: X-ray, Synchrotron Neutron Tech. 2 (4), 616 (2008).
L. L. Chang, L. Esaki, and R. Tsu, Appl. Phys. Lett. 24 (11), 593 (1974). https://doi.org/10.1063/1.1655067
G. González-Cordero, F. Jiménez-Molinos, J. Bautista Roldán, et al., J. Vac. Sci. Technol., B: Nanotechnol. Microelectron.: Mater., Process., Meas., Phenom. 35 (1), 01A110 (2017). https://doi.org/10.1116/1.4973372
R. Tsu and L. Esaki, Appl. Phys. Lett. 22 (11), 562 (1973). https://doi.org/10.1063/1.1654509
L. D. Landau and E. M. Lifshits, Quantum Mechanics: Non-Relativistic Theory, Vol. 3 of Course of Theoretical Physics (Pergamon Press, Oxford, 1977).
A. Zenkevich, Yu. Lebedinskii, O. Gorshkov, et al., in Advances in Diverse Industrial Applications of Nanocomposites, Ed. by R. B. Rijeka (InTech, 2011), p. 317.
D. O. Filatov, M. A. Lapshina, D. A. Antonov, et al., J. Phys.: Conf. Ser. 245, 012 018 (2010). https://doi.org/10.1088/1742-6596/245/1/012018
Physical Properites of Semiconductors. New Semiconductor Materials Database. http://www.matprop.ru/.
T. E. Perevalov, A. V. Shaposhnikov, K. A. Nasyrov, et al., in Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices, Ed. by E. V. Gusev (Springer, Berlin, Heidelberg, 2006), p. 423.
R. Ludeke, A. Bauer, and E. Cartier, Appl. Phys. Lett. 66 (6), 730 (1995). https://doi.org/10.1063/1.114114
Physical and Chemical Properties of Oxides. Handbook, Ed. by G. V. Samsonov (Metallurgiya, Moscow, 1978) [in Russian].
Tables of Physical Quantities. Handbook, Ed. by I. K. Kikoin, (Atomizdat, Moscow, 1976,) [in Russian].
D. Filatov, D. Guseinov, D. Antonov, et al., RSC Adv. 4, 57 337 (2014). https://doi.org/10.1039/C4RA10236C
L. Quattropani, I. Maggio-Aprile, P. Niedermann, and O. Fisher, Phys. Rev. B 57 (11), 6623 (1998). https://doi.org/10.1103/PhysRevB.57.6623
C. Weisbuch and B. Vinter, Quantum Semiconductor Structures: Fundamentals and Applications (Academic Press, New York, 1991). https://doi.org/10.1002/adma.19920040619
ACKNOWLEDGMENTS
This work was supported by the Government of the Russian Federation (grant no. 14.Y26.31.0021). The tunneling AFM measurements were performed using equipment of the Center for Shared Use “Physics of Solid Nanostructures” (Lobachevsky Nizhny Novgorod State University).
Author information
Authors and Affiliations
Corresponding author
Additional information
Translated by O. Maslova
Rights and permissions
About this article
Cite this article
Filatov, D.O., Kazantseva, I.A., Antonov, D.A. et al. Observation of Quantum-Size Effects in a Study of Resistive Switching in Dielectric Films with Au Nanoparticles via Tunneling Atomic Force Microscopy. J. Surf. Investig. 13, 23–29 (2019). https://doi.org/10.1134/S1027451019010063
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1027451019010063