Abstract
The paper describes the thermodynamic modeling and experimental study of the synthesis of vanadium oxide films at various temperatures from the tetrakis(ethylmethylaminovanadium) V[NC3H8]4 precursor in the presence of oxygen in an argon atmosphere. The thermodynamic modeling was carried out using the calculation of chemical equilibria based on the minimization of the Gibbs energy of the system. In the experimental part of the paper, the films were synthesized by the atomic layer deposition procedure. The thermodynamic modeling and experimental results agree with each other and can be used to develop procedures for the synthesis of film coatings based on vanadium oxides.
Similar content being viewed by others
Notes
The phase complex is a set of condensed phases that occur in equilibrium with one another and with the gas phase.
The lower the graphite content in the phase complex, the lower the oxygen amount (and the shorter the time) required to perform the second stage of the process.
The contents of argon (m(Ar) = 1) an nitrogen (m(N2) = 0.5) in the process remain invariable and are not shown in Fig. 2.
REFERENCES
M. F. Jager, C. Ott, P. M. Kraus, et al., Proc. Natl. Acad. Sci. U.S.A. 114, 9558 (2017). https://doi.org/10.1073/pnas.1707602114
F. J. Morin, Phys. Rev. Lett. 3, 34 (1959). https://doi.org/10.1103/PhysRevLett.3.34
Z. Shao, X. Cao, H. Luo, et al., NPG Asia Mater. 10, 581 (2018). https://doi.org/10.1038/s41427-018-0061-2
K. Liu, S. Lee, S. Yang, et al., Mater. Today 21, 875 (2018). https://doi.org/10.1016/j.mattod.2018.03.029
C. Lu, Q. Lu, M. Gao, et al., Nanomaterials 11, 114 (2021). https://doi.org/10.3390/nano11010114
H. J. Schlag and W. Scherber, Thin Solid Films 366, 28 (2000). https://doi.org/10.1016/S0040-6090(00)00711-2
KanaJ. B. Kana, J. M. Ndjaka, G. Vignaud, et al., Opt. Commun. 284, 807 (2011). https://doi.org/10.1016/j.optcom.2010.10.009
J. Sun and G. K. Pribil, Appl. Surf. Sci. 421, 819 (2017). https://doi.org/10.1016/j.apsusc.2016.09.125
R. M. Briggs, I. M. Pryce, and H. A. Atwater, Opt. Express 18, 11192 (2010). https://doi.org/10.1364/oe.18.011192
V. Y. Prinz, S. V. Mutilin, L. V. Yakovkina, et al., Nanoscale 12, 3443 (2020). https://doi.org/10.1039/C9NR08712E
S. V. Mutilin, V. Y. Prinz, V. A. Seleznev, et al., Appl. Phys. Lett. 113, 043101 (2018). https://doi.org/10.1063/1.5031075
S. V. Mutilin, V. Y. Prinz, L. V. Yakovkina, et al., CrystEngComm 23, 443 (2021). https://doi.org/10.1039/D0CE01072C
Zhou. You and S. Ramanathan, Proc. IEEE 103, 1289 (2015). https://doi.org/10.1109/JPROC.2015.2431914
Z. Yang, C. Ko, and S. Ramanathan, Annu. Rev. Mater. Res. 41, 337 (2011). https://doi.org/10.1146/annurev-matsci-062910-100347
M. Nakano, K. Shibuya, N. Ogawa, et al., Appl. Phys. Lett. 103, 153503 (2013). https://doi.org/10.1063/1.4824621
M. A. Kats, R. Blanchard, S. Zhang, et al., Phys. Rev. X 3, 041004 (2013). https://doi.org/10.1103/PhysRevX.3.041004
C. Rios, P. Hosseini, C. D. Wright, et al., Adv. Mater. 26, 1372 (2014). https://doi.org/10.1002/adma.201304476
J. Faucheu, E. Bourgeat-Lami, and V. Prevot, Adv. Eng. Mater. 1800438 (2018). https://doi.org/10.1002/adem.201800438
Y. Ke, S. Wang, G. Liu, et al., Small 14, 1802025 (2018). https://doi.org/10.1002/smll.201802025
T.-J. K. Liu and K. Kuhn, CMOS and Beyond (Cambridge University Press, Cambridge, 2014). https://doi.org/10.1017/CBO9781107337886
H.-F. Zhu, L.-H. Du, J. Li, et al., Appl. Phys. Lett. 112, 081103 (2018). https://doi.org/10.1063/1.5020930
C. Ko, Z. Yang, and S. Ramanathan, ACS Appl. Mater. Interfaces 3, 3396 (2011). https://doi.org/10.1021/am2006299
M. M. Qazilbash, M. Brehm, B.-G. Chae, et al., Science 318, 1750 (2007). https://doi.org/10.1126/science.1150124
A. Zimmers, L. Aigouy, M. Mortier, et al., Phys. Rev. Lett. 110, 056601 (2013). https://doi.org/10.1103/PhysRevLett.110.056601
Y. J. Chang, J. S. Yang, Y. S. Kim, et al., Phys. Rev. B 76, 075118 (2007). https://doi.org/10.1103/PhysRevB.76.075118
M. M. Qazilbash, A. Tripathi, A. A. Schafgans, et al., Phys. Rev. 83, 165108 (2011). https://doi.org/10.1103/PhysRevB.83.165108
D. Stroud, Phys. Rev. B 12, 3368 (1975). https://doi.org/10.1103/PhysRevB.12.3368
N. Inomata, T. Usuda, Y. Yamamoto, et al., Sensors Actuators A: Phys. 346, 113823 (2022). https://doi.org/10.1016/j.sna.2022.113823
G. Li, D. Xie, H. Zhong, et al., Nat. Commun. 13, 1729 (2022). https://doi.org/10.1038/s41467-022-29456-5
L. V. Yakovkina, S. V. Mutilin, V. Y. Prinz, et al., J. Mater. Sci. 52, 4061 (2017). https://doi.org/10.1007/s10853-016-0669-y
Y. Zhang, W. Xiong, W. Chen, et al., Nanomaterials 11, 338 (2021). https://doi.org/10.3390/nano11020338
X. Xue, Z. Zhou, B. Peng, et al., RSC Adv. 5, 79249 (2015). .https://doi.org/10.1039/C5RA13349A
R. Shi, N. Shen, J. Wang, et al., Appl. Phys. Rev. 6, 011312 (2019). https://doi.org/10.1063/1.5087864
J. Li, Z. An, W. Zhang, et al., Appl. Surf. Sci. 529, 147108 (2020). https://doi.org/10.1016/j.apsusc.2020.147108
M. Brahlek, L. Zhang, J. Lapano, et al., MRS Commun. 7, 27 (2017). https://doi.org/10.1557/mrc.2017.2
V. P. Prasadam, N. Bahlawane, F. Mattelaer, et al., Mater. Today Chem. 12, 396 (2019). https://doi.org/10.1016/j.mtchem.2019.03.004
G. Bai, K. M. Niang, and J. Robertson, J. Vac. Sci. Technol., A 38, 052402 (2020). https://doi.org/10.1116/6.0000353
K. M. Niang, G. Bai, and J. Robertson, J. Vac. Sci. Technol., A 38, 042401 (2020). .https://doi.org/10.1116/6.0000152
A. C. Kozen, H. Joress, M. Currie, et al., J. Phys. Chem. C 121, 19341 (2017). https://doi.org/10.1021/acs.jpcc.7b04682
V. A. Shestakov and M. L. Kosinova, Russ. Chem. Bull. 70, 283 (2021).
V. A. Shestakov and M. L. Kosinova, Russ. J. Inorg. Chem. 66, 1703 (2021).
V. A. Shestakov, V. I. Kosyakov, and M. L. Kosinova, Russ. J. Inorg. Chem. 65, 898 (2020). https://doi.org/10.1134/S0036023621110164
V. A. Shestakov, L. V. Yakovkina, and V. N. Kichay, Russ. J. Inorg. Chem. 67, 1956 (2022). https://doi.org/10.1134/S0036023622601179
I. S. Merenkov, H. Katsui, M. N. Khomyakov, et al., J. Eur. Ceram. Soc. 39, 5123 (2019). https://doi.org/10.1016/j.jeurceramsoc.2019.08.006
V. A. Titov, V. I. Kosyakov, and F. A. Kuznetsov, Problems of Electronic Materials Science (Nauka, Novosibirsk, 1986) [in Russian].
Y.-B. Kang, J. Eur. Ceram. Soc. 32, 3187 (2012). https://doi.org/10.1016/j.jeurceramsoc.2012.04.045
I. Barin, Termodynamical Data of Pure Substances (New York, 1989).
A. Mahmoodinezhad, C. Janowitz, F. Naumann, et al., J. Vac. Sci. Technol., A 38, 022404 (2020). .https://doi.org/10.1116/1.5134800
K. Henkel, H. Gargouri, B. Gruska, et al., J. Vac. Sci. Technol. A: Vacuum, Surfaces, Film 32, A107 (2013). https://doi.org/10.1116/1.4831897
J. Haeberle, K. Henkel, H. Gargouri, et al., Beilstein J. Nanotechnol. 4, 732 (2013). https://doi.org/10.3762/bjnano.4.83
Inorganic. Files, International Centre for Diffraction Data, Pennsylvania, USA, 2010.
F. Ureña-Begara, A. Crunteanu, and J. P. Raskin, Appl. Surf. Sci. 403, 717 (2017). https://doi.org/10.1016/j.apsusc.2017.01.160
ACKNOWLEDGEMENTS
The authors thank the core facilities VTAN, Novosibirsk State University, for measurement of RS spectra and the center for collective use “Nanostructures” for providing the ALD setup for experiments.
Funding
The experimental studies were carried out at the Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, and were supported by the Russian Science Foundation (project no. 21-19-00873). Thermodynamic modeling was performed at the Nikolaev Institute of Inorganic Chemistry, Siberian Branch, Russian Academy of Sciences, and supported by the Ministry of Science and Higher Education of the Russian Federation (project no. 121031700314-5).
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
The authors declare that they have no conflicts of interest.
Additional information
Translated by Z. Svitanko
Rights and permissions
About this article
Cite this article
Shestakov, V.A., Seleznev, V.A., Mutilin, S.V. et al. Thermodynamic Modeling and Experimental Implementation of the Synthesis of Vanadium Oxide Films. Russ. J. Inorg. Chem. 68, 580–586 (2023). https://doi.org/10.1134/S0036023623600491
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S0036023623600491