Abstract
In this paper, we solve the inverse problem of magneto-optical ellipsometry for thin ferromagnetic films with optical uniaxial anisotropy. We work within the framework of the approach we developed earlier analyzing magnetoellipsometric data without using fourth-order M-matrices. We work with ellipsometric relations, in which we take into account the magneto-optical contribution as perturbations, and ellipsometric measurements are carried out on a setup with a simple dipole scheme based on the transverse magneto-optical Kerr effect. We add the magneto-optical response to the expressions known in the literature for the reflection coefficients of anisotropic thin films, which are related to the parameters measured by magneto-optical ellipsometry. As a result, by analyzing the obtained expressions for the reflection coefficients, we obtain information on the total permittivity tensor of a thin film.
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Funding
The research was performed at the Magnetic MAX Materials Laboratory of the Kirensky Institute of Physics SB RAS (created under Megagrant project (agreement no. 075-15-2019-1886) with the financial support of the Russian Science Foundation no. 21-12-00226, http://rscf.ru/project/21-12-00226/.
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Maximova, O.A., Lyaschenko, S.A., Varnakov, S.N. et al. Magneto-Optical Ellipsometry of Thin Films with Optical Uniaxial Anisotropy. Phys. Metals Metallogr. 124, 1654–1661 (2023). https://doi.org/10.1134/S0031918X23601385
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DOI: https://doi.org/10.1134/S0031918X23601385