Abstract
Central tendencies of the development of X-ray microanalysis of minerals are considered. The development of X-ray microanalysis passed through a number of stages. The present stage is characterized by production of computer-controlled microanalyzers capable of maintaining high stability of the electron beam at a high probe current for a long time. This provides powerful technical support of high-current X-ray microanalysis of minerals, which is currently becoming widespread. Microanalysis at high currents and long counting times improves the measurement reproducibility and makes it possible to lower the detection limit in trace analysis.
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Original Russian Text © Yu.G. Lavrent’ev, 2009, published in Zavodskaya Laboratoriya. Diagnostika materialov, 2009, Vol. 75, No. 8, pp. 4–10.
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Lavrent’ev, Y.G. New trends in X-ray microanalysis of minerals (Review). Inorg Mater 46, 1605–1612 (2010). https://doi.org/10.1134/S0020168510150021
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DOI: https://doi.org/10.1134/S0020168510150021