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New trends in X-ray microanalysis of minerals (Review)

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Inorganic Materials Aims and scope

Abstract

Central tendencies of the development of X-ray microanalysis of minerals are considered. The development of X-ray microanalysis passed through a number of stages. The present stage is characterized by production of computer-controlled microanalyzers capable of maintaining high stability of the electron beam at a high probe current for a long time. This provides powerful technical support of high-current X-ray microanalysis of minerals, which is currently becoming widespread. Microanalysis at high currents and long counting times improves the measurement reproducibility and makes it possible to lower the detection limit in trace analysis.

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References

  1. Castaing, R., Advances in Electronics and Electron Physics, New York: Academic, 1960, vol. 13, pp. 317–384.

    Google Scholar 

  2. Heinrich, K.F.J., The Electron Microprobe, New York: Wiley, 1966, pp. 841–997, 999–1030.

    Google Scholar 

  3. Keil, K., Microprobe Analysis, New York: Wiley, 1973, pp. 189–239.

    Google Scholar 

  4. Quantitative Electron Probe Microanalysis, Scott, V. D. and Love, G. Eds., Chichester: Wiley, 1983.

    Google Scholar 

  5. Electron Probe Quantitation, Heinrich, K.F.J. and Newbury, D.E., Eds., New York: Plenum, 1991.

    Google Scholar 

  6. Lavrent’ev, Yu.G., Korolyuk, V.N., and Usova, L.V., Zh. Anal. Khim., 2004, vol. 59, no. 7, pp. 678–696 [J. Anal. Chem. (Engl. Transl.), vol. 59, no. 7, pp. 600–616].

    Google Scholar 

  7. Orlic, I., Loh, K.K., Sow, C.H., Tang, S.M., and Thong, P., Nucl. Instrum. Methods Phys. Res., Ser. B, 1993, vol. 74, pp. 352–361.

    Article  Google Scholar 

  8. Finkel’shtein, A.L. and Farkov, P.M., Anal. Kontrol., 2002, vol. 6, no. 4, pp. 377–382.

    Google Scholar 

  9. Ebel, H., Svagera, R., Ebel, M.F., et al., X-Ray Spectrometry, 2003, vol. 32, no. 6, pp. 442–451.

    Article  CAS  Google Scholar 

  10. Shaltout, A., Ebel, H., and Svagera, R., X-Ray Spectrometry, 2006, vol. 35, no. 1, pp. 52–56.

    Article  CAS  Google Scholar 

  11. Heinrich, K.F.J., In the Electron Microprobe, New York: Wiley, 1966, pp. 296–377.

    Google Scholar 

  12. Heinrich, K.F.J., Proc. 11th Int. Congress on X-ray Optics and Microanalysis, Brown, J.D. and Fackwood, R.H., Eds., Ontario Univ. Press, 1987, pp. 67–119.

  13. Korolyuk, V.N., Lavrent’ev, Yu.G., Usova, L.V., and Nigmatulina, E.N., Geol. Geofiz., 2008, vol. 49, no. 3, pp. 221–225 [Russian Geol. Geophys. (Engl. Transl.), vol. 49, no. 3, pp. 165–168].

    CAS  Google Scholar 

  14. Sobolev, A.V., Hoffman, A.W., Kuzmin, D.V., et al., Science, 2007, vol. 316, pp. 412–417.

    Article  CAS  Google Scholar 

  15. Jarosewich, E.J., Nelen, J.A., and Norberg, J.A., Geostand. Newslett., 1980, vol. 4, no. 1, pp. 43–47.

    Article  Google Scholar 

  16. Canil, D., Contrib. Mineral. Petrol., 1999, vol. 136, pp. 240–246.

    Article  CAS  Google Scholar 

  17. Boyd, F.R., in Planetary Petrology and Geochemistry: The Lawrence A. Taylor 60th Birthday volume, Snyder, G.A., Neal, C.R., and Ernst, W.G., Eds., Hanover: Geological Society of America, 1999, pp. 5–14.

    Google Scholar 

  18. Taskaev, V.I. and Dardykina, L.N., Abstracts of Papers, XV Vsesoyuznoe soveshchanie po rentgenovskoi i elektronnoi spektroskopii (XV All-Union Conf. on X-Ray and Electron Spectroscopy), Leningrad: LNPO “Burevestnik”, vol. 2, 1988, pp. 91–92.

    Google Scholar 

  19. Sobolev, N.V., Logvinova, A.M., and Zedgenizov, D.A., Eur. J. Mineral, 2008, vol. 20, pp. 305–315.

    Article  CAS  Google Scholar 

  20. Ryan, C.G. and Griffin, W.L., J. Geophys, Res, 1996, vol. 101, no. B3, pp. 5611–5625.

    Article  CAS  Google Scholar 

  21. Lavrent’ev, Yu.G., Usova, L.V., Korolyuk, V.N., and Logvinova, A.M., Geol. Geofiz., 2005, vol. 46, no. 7, pp. 741–745 [Russian Geol. Geophys. (Engl. Transl.), vol. 46, no. 7, pp. 725–730].

    Google Scholar 

  22. Lavrent’ev, Yu.G., Korolyuk, V.N., Usova, L.V., and Logvinova, A.M., Geol. Geofiz., 2006, vol. 47, no. 10, pp. 1090–1093 [Russian Geol. Geophys. (Engl. Transl.), vol. 47, no. 10, pp. 1086–1089].

    Google Scholar 

  23. Solov’eva, L.V., Lavrent’ev, Yu.G., Egorov, K.N., et al., Geol. Geofiz., 2008, vol. 49, no. 4, pp. 281–301 [Russian Geol. Geophys. (Engl. Transl.), vol. 49, no. 4, pp. 207–224].

    Google Scholar 

  24. Itaya, T., Sajeev, K., Clark, C., and Kusiak, M.A., Gondwana Res, 2008, vol. 14, pp. 567–568.

    Article  Google Scholar 

  25. Suzuki, K. and Kato, T., Gondwana Res, 2008, vol. 14, pp. 569–586.

    Article  CAS  Google Scholar 

  26. Korolyuk, V.N. and Lavrent’ev, Yu.G., in Rentgenovskii mikroanaliz s elektronnym zondom v mineralogii. Materialy XI s”ezda MMA (Electron Probe X-Ray Microanalysis in Mineralogy. Proc. XI Congress of MMA), Moscow: Nauka, 1980, pp. 7–13.

    Google Scholar 

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Correspondence to Yu. G. Lavrent’ev.

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Original Russian Text © Yu.G. Lavrent’ev, 2009, published in Zavodskaya Laboratoriya. Diagnostika materialov, 2009, Vol. 75, No. 8, pp. 4–10.

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Lavrent’ev, Y.G. New trends in X-ray microanalysis of minerals (Review). Inorg Mater 46, 1605–1612 (2010). https://doi.org/10.1134/S0020168510150021

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