Abstract
Studies on Josephson samplers are reviewed. The dynamic properties of Josephson junctions used as sensitive comparators in the samplers are analyzed. A theory in terms of which the time resolution and sensitivity of Josephson comparators can be estimated is put forward, and analytical formulas for the limiting characteristics of the samplers are derived. The performance of Josephson samplers based on high-temperature superconductors is discussed. It is shown that samplers with a subpicosecond resolution and nanoampere sensitivity are a feasibility.
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Original Russian Text © I.N. Askerzade, 2006, published in Zhurnal Tekhnicheskoĭ Fiziki, 2006, Vol. 76, No. 4, pp. 1–8.
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Askerzade, I.N. Josephson-effect samplers: A review. Tech. Phys. 51, 393–400 (2006). https://doi.org/10.1134/S1063784206040013
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DOI: https://doi.org/10.1134/S1063784206040013