Abstract
The experimental current-voltage characteristics and dependences of the external quantum yield on the current density of light-emitting diodes based on InGaN/GaN multiple quantum wells for the wide temperature range T = 10–400 K are presented. It is shown that, at low-temperatures T < 100 K, the injection of holes into the quantum wells occurs from localized acceptor states. The low-temperature injection of electrons into p-GaN occurs due to quasi-ballistic transport in the region of multiple quantum wells. An increase in temperature leads to an increase in the current which is governed by thermally activated hole and electron injection from the allowed bands of GaN.
Similar content being viewed by others
References
Di Zhu, J. Xu, A. N. Noemaun, J. K. Kim, E. F. Schubert, M. H. Crawford, and D. D. Koleske, Appl. Phys. Lett. 94, 081113 (2009).
D. Yan, H. Lu, D. Chen, R. Zhang, and Y. Zheng, Appl. Phys. Lett. 96, 083504 (2010).
G.-B. Lin, D. Meyaard, J. Cho, E. F. Schubert, H. Shim, and C. Sone, Appl. Phys. Lett. 100, 161106 (2012).
X. Ni, X. Li, J. Lee, S. Liu, V. Avrutin, A. Matulionis, Ü. Özgür, and H. Morkoç, Superlatt. Microstr. 48, 133 (2010)
V. E. Kudryashov, S. S. Mamakin, A. N. Turkin, A. E. Yunovich, A. N. Kovalev, and F. I. Manyakhin, Semiconductors 35, 827 (2001).
S. S. Mamakin, A. E. Yunovich, A. B. Vattana, and F. I. Manyakhin, Semiconductors 37, 1107 (2003).
L. X. Zhao, E. J. Thrush, C. J. Humphreys, and W. A. Phillips, J. Appl. Phys. 103, 024501 (2008).
I. A. Prudaev, I. V. Ivonin, and O. P. Tolbanov, Russ. Phys. J. 54, 1372 (2012).
N. I. Bochkareva, V. V. Voronenkov, R. I. Gorbunov, A.S. Zubrilov, Yu. S. Lelikov, F. E. Latyshev, Yu. T. Rebane, A. I. Tsyuk, and Yu. G. Shreter, Semiconductors 44, 794 (2010).
D. S. Meyaard, G.-B. Lin, Q. Shan, J. Cho, E. F. Schubert, H. Shim, M.-H. Kim, and C. Sone, Appl. Phys. Lett. 99, 251115 (2011).
J. J. Harris, K. J. Lee, I. Harrison, L. B. Flannery, D. Korakakis, T. S. Cheng, C. T. Foxon, Z. Bougrioua, I. Moerman, W. van der Stricht, E. J. Thrush, B. Hamilton, and K. Ferhah, Phys. Status Solidi A 176, 363 (1999).
H. Nakayama, P. Hacke, M. R. H. Khan, T. Detchprochm, K. Hiramatsu, and N. Sawaki, Jpn. J. Appl. Phys. 35, 282 (1996).
D. S. Sizov, R. Bhat, A. Zakharian, K. Song, D. E. Allen, S. Coleman, and Chung-en Zah, IEEE J. Sel. Top. Quantum Electron. 17, 1390 (2011).
M. S. Kumar, S. J. Chung, H. W. Shim, C.-H. Hong, E.-K. Suh, and H. J. Lee, Semicond. Sci. Technol. 19, 725 (2004).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © I.A. Prudaev, I.Yu. Golygin, S.B. Shirapov, I.S. Romanov, S.S. Khludkov, O.P. Tolbanov, 2013, published in Fizika i Tekhnika Poluprovodnikov, 2013, Vol. 47, No. 10, pp. 1391–1395.
Rights and permissions
About this article
Cite this article
Prudaev, I.A., Golygin, I.Y., Shirapov, S.B. et al. Influence of temperature on the mechanism of carrier injection in light-emitting diodes based on InGaN/GaN multiple quantum wells. Semiconductors 47, 1382–1386 (2013). https://doi.org/10.1134/S1063782613100230
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063782613100230