Abstract
Silicon oxide aerogel samples irradiated with x rays at room temperature have been analyzed using the electron paramagnetic resonance method. It has been found that three types of paramagnetic centers appear: paramagnetic centers with a g factor of 2.0035, centers associated with the presence of protons in SiO2 globules, and centers in the adsorbed film on the aerogel surface. The fast (T fast = 30 h) and slow (T slow = 70 d) processes have been revealed in the recombination of these centers.
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Original Russian Text © G.V. Mamin, A.A. Rodionov, M.S. Tagirov, D.A. Tayurskii, N. Mulders, 2008, published in Pis’ma v Zhurnal Éksperimental’noĭ i Teoreticheskoĭ Fiziki, 2008, Vol. 88, No. 4, pp. 281–285.
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Mamin, G.V., Rodionov, A.A., Tagirov, M.S. et al. Electron paramagnetic resonance of radiation-induced paramagnetic centers in an aerogel. Jetp Lett. 88, 244–248 (2008). https://doi.org/10.1134/S0021364008160042
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DOI: https://doi.org/10.1134/S0021364008160042