Abstract
Chitosan-carbon materials produced by electrochemical deposition of chitosan on an activated carbon fiber (ACF) as an electrode have been studied by atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). AFM data demonstrate that the microstructure of the coating depends on whether chitosan is deposited in soluble or insoluble form. XPS data are used to evaluate the state of chitosan in the composites in relation to the deposition conditions.
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Original Russian Text © Yu.M. Nikolenko, V.G. Kuryavyi, I.V. Sheveleva, L.A. Zemskova, V.I. Sergienko, 2010, published in Neorganicheskie Materialy, 2010, Vol. 46, No. 3, pp. 266–271.
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Nikolenko, Y.M., Kuryavyi, V.G., Sheveleva, I.V. et al. Atomic force microscopy and X-ray photoelectron spectroscopy study of chitosan-carbon fiber materials. Inorg Mater 46, 221–225 (2010). https://doi.org/10.1134/S0020168510030027
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DOI: https://doi.org/10.1134/S0020168510030027