Abstract
Using the molecular dynamics method, the sputtering of a copper target and the subsequent formation of a copper nanofilm on a silicon substrate has been modeled. The process parameters corresponded to the conditions in low-pressure gas-discharge plasma. The obtained values of the sputtering coefficient are consistent with experimental data. The nanofilm growth rate has been determined.
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This work was supported by the Russian Science Foundation, project no. 19-71-10055.
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Translated by S. Zatonsky
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Fairushin, I.I., Shemakhin, A.Y. & Khabir’yanova, A.A. Molecular Dynamics Simulation of Copper Nanofilm Self-Assembly on Silicon Substrate under Gas-Discharge Plasma Conditions. High Energy Chem 55, 399–401 (2021). https://doi.org/10.1134/S0018143921050039
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DOI: https://doi.org/10.1134/S0018143921050039