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Length of diagnostic tests for Boolean circuits

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References

  1. O. B. Lupanov, Asymptotic Complexity Estimates for Control Systems (Izd. Moskov. Univ., Moscow, 1984) [in Russian].

    Google Scholar 

  2. S. V. Yablonskii, Elements of Cybernetics (Vysshaya Shkola, Moscow, 2007) [in Russian].

    MATH  Google Scholar 

  3. N. P. Red’kin, Circuit Reliability and Diagnostics (Izd. Moskov. Univ., Moscow, 1992) [in Russian].

    MATH  Google Scholar 

  4. S. V. Kovatsenko, Vestnik Moskov. Univ. Ser. XV Vychisl. Mat. Kibernet., No. 2, 45–47 (2000).

    Google Scholar 

  5. N. P. Red’kin, in Math. Aspects of Cybernetics (Fizmatlit, Moscow, 2003), Vol. 12, pp. 217–230 [in Russian].

    Google Scholar 

  6. Yu. V. Borodina, VestnikMoskov. Univ. Ser. IMat. Mekh., No. 1, 49–52 (2008) [Moscow Univ. Math. Bull. 63 (5), 202–204 (2008)].

    Google Scholar 

  7. Yu. V. Borodina and P. A. Borodin, Diskret. Mat. 22 (3), 127–133 (2010) [Discrete Math. Appl. 20 (4), 441–449 (2010)].

    Article  Google Scholar 

  8. D. S. Romanov, Diskret. Mat. 25 (2), 104–120 (2013) [Discrete Math. Appl. 23 (3–4), 343–362 (2010)].

    Article  Google Scholar 

  9. D. S. Romanov, Diskret. Mat. 26 (2), 100–130 (2014) [Discrete Math. Appl. 24 (4), 227–251 (2010)].

    Article  MathSciNet  Google Scholar 

  10. K. A. Popkov, Preprint No. 074 (Keldysh Inst. Appl. Math, Moscow, 2015) [in Russian].

    Google Scholar 

  11. K. A. Popkov, Preprint No. 050 (Keldysh Inst. Appl. Math, Moscow, 2016) [in Russian].

    Google Scholar 

  12. N. I. Turdaliev, in Discrete Analysis Methods for the Optimization of Control Systems (Izd. Inst. Mat. Sibirsk. Otd. Akad. Nauk SSSR, Novosibirsk, 1989), Vol. 49, pp. 60–74 [in Russian].

    Google Scholar 

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Correspondence to N. P. Red’kin.

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Original Russian Text © N. P. Red’kin, 2017, published in Matematicheskie Zametki, 2017, Vol. 102, No. 4, pp. 624–627.

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Red’kin, N.P. Length of diagnostic tests for Boolean circuits. Math Notes 102, 580–582 (2017). https://doi.org/10.1134/S0001434617090310

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