Skip to main content
SpringerLink
Log in

An experimental study of millimeter wave absorption in thin metal films

  • Published:
Technical Physics Letters Aims and scope Submit manuscript

Abstract

Optical characteristics (R, T, A) of thin aluminum films with thicknesses from 1.7 to 15 nm were studied at a wavelength of 8 mm with allowance for a substrate material. The absorption exhibits a maximum for a film thickness of 2.5 nm. The experimental data are interpreted taking into account the dependence of electric conductivity on film thickness.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. G. E. H. Reuter and E. H. Sondheimer, Proc. R. Soc. London, Ser. A 195, 336 (1948).

    ADS  Google Scholar 

  2. A. E. Kaplan, Radiotekh. Élektron. (Moscow) 9, 1781 (1964).

    Google Scholar 

  3. V. G. Andreev, V. A. Vdovin, and A. A. Karabutov, Izv. Ross. Akad. Nauk, Ser. Fiz. 66, 1750 (2002).

    Google Scholar 

  4. G. V. Rosenberg, Optics of Thin Coatings (Fizmatgiz, Moscow, 1958).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow, Russia

    V. G. Andreev, V. A. Vdovin & P. S. Voronov

Authors
  1. V. G. Andreev
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. A. Vdovin
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. P. S. Voronov
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

__________

Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 29, No. 22, 2003, pp. 68–73.

Original Russian Text Copyright © 2003 by Andreev, Vdovin, Voronov.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Andreev, V.G., Vdovin, V.A. & Voronov, P.S. An experimental study of millimeter wave absorption in thin metal films. Tech. Phys. Lett. 29, 953–955 (2003). https://doi.org/10.1134/1.1631376

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1134/1.1631376

Keywords

Search

Navigation