Abstract
The crystal structure of the synthetic Ge-modification of the mineral natisite, Na2{ TiOGeO4}, has been refined by X-ray diffraction method (a four-circle diffractometer, 2θ/θ scanning, MoK α-radiation, θmax = 50°: a = 6.658(1), c = 5.161(1) Å, sp. gr. P4/nmm, Z = 2, ρcalcd = 3.58 g/cm3, R1 = 0.030, s = 1.131, wR(F 2) = 0.058 (352 reflections with I≥2σI). The comparative crystallochemical analysis of the related (including hypothetical) phases with the anionic {MTO 5} radicals (M = Ti, V, Ge; T = Ge, Si, P) is performed with the aim of revealing a possible relationship between the composition and the structure type of the compounds.
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Translated from Kristallografiya, Vol. 45, No. 4, 2000, pp. 635–641.
Original Russian Text Copyright © 2000 by Yakubovich, Kireev, Mel’nikov.
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Yakubovich, O.V., Kireev, V.V. & Mel’nikov, O.K. Refinement of crystal structure of a Ge-analogue of natisite Na2{TiGeO4} and prediction of new phases with anionic {MTO5} radicals. Crystallogr. Rep. 45, 578–584 (2000). https://doi.org/10.1134/1.1306565
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DOI: https://doi.org/10.1134/1.1306565