Precision Lens Mounting Monitored By Interfering Beams

Philip Lam

doi:10.1117/12.950960

1 May 1989 Precision Lens Mounting Monitored By Interfering Beams

Philip Lam

Proceedings Volume 1036, Precision Instrument Design; (1989) https://doi.org/10.1117/12.950960
Event: SPIE Advanced Processing Technologies for Optical and Electronic Devices (colocated wth OPTCON), 1988, Santa Clara, CA, United States

Abstract

A two-beams interference technique developed to test the wedge of a lens (Ref. 1) has been applied to precision mounting of optical systems. When an optical system requires very high centration and tolerates very little tilt for each of its optical elements, one way of achieving that goal is to mount each individual lens well-aligned in a sub-cell, and the sub-cells are made press-fit to the main lens housing. The main housing and sub-cells are made with high mechanical precision. A twelve lenses optical system for a laser scanner has been assembled that way, the whole optical system achieves diffraction limited quality.

Citation Download Citation

Philip Lam "Precision Lens Mounting Monitored By Interfering Beams", Proc. SPIE 1036, Precision Instrument Design, (1 May 1989); https://doi.org/10.1117/12.950960

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available