Optical Constants In The Extreme Ultraviolet And Soft X-Ray Region

J. C. Rife; J. F. Osantowski

doi:10.1117/12.932995

3 May 1982 Optical Constants In The Extreme Ultraviolet And Soft X-Ray Region

J. C. Rife, J. F. Osantowski

Proceedings Volume 0315, Reflecting Optics for Synchrotron Radiation; (1982) https://doi.org/10.1117/12.932995
Event: 1981 Brookhaven Conferences, 1981, Upton, United States

Abstract

The nature of optical constants and their measurement by reflection or absorption techniques in the extreme ultraviolet and soft x-ray spectral region from 30 to 3000eV is discussed with emphasis on mirror design. Sources of optical constant data are mentioned and reflectance measurements for SiC and Kanigen between 40 and 200 eV are reported.

Citation Download Citation

J. C. Rife and J. F. Osantowski "Optical Constants In The Extreme Ultraviolet And Soft X-Ray Region", Proc. SPIE 0315, Reflecting Optics for Synchrotron Radiation, (3 May 1982); https://doi.org/10.1117/12.932995

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available