Lifetime prediction of diode lasers with different aging behavior

Yajun Li

doi:10.1117/12.713935

27 February 2007 Lifetime prediction of diode lasers with different ageing behavior

Yajun Li

Proceedings Volume 6485, Novel In-Plane Semiconductor Lasers VI; 648519 (2007) https://doi.org/10.1117/12.713935
Event: Integrated Optoelectronic Devices 2007, 2007, San Jose, California, United States

Abstract

Regression models are developed for lifetime prediction of diode lasers with increasing or decreasing operating current in the gradual degradation stage of their lifetime. Programmable expressions for laser lifetime extrapolation are presented. Analytical results are explicated by case examples based on measured data from reliability tests of commercially available 10mW and 650nm wavelength InGaAlP lasers conducted under accelerated ageing conditions.

Citation Download Citation

Yajun Li "Lifetime prediction of diode lasers with different ageing behavior", Proc. SPIE 6485, Novel In-Plane Semiconductor Lasers VI, 648519 (27 February 2007); https://doi.org/10.1117/12.713935

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