Paper
7 September 2006 Modeling particle distributions for stray light analysis
Author Affiliations +
Abstract
There has been a general awareness for several years that the IEST-STD-CC1246 standard particle distribution with a slope of -0.926 does not reasonably represent the contamination on optics that have not been recently cleaned. As a result, the CL (Cleanliness Level) nomenclature actually counters effective communication and modeling of particulate contamination scatter. An analysis method and communication standard centered on Percent Areal Coverage (PAC) and particle distribution slope is presented that improves the ability of Contamination Engineering and Stray Light Engineering to tackle ever more difficult instrument stray light requirements in the most cost-effective manner. Modeling the expected particle distributions for multiple contamination species improves accuracy and reduces costly overdesign.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John Fleming, Bruce Matheson, Michael G. Dittman, Frank Grochocki, and Brenda Firth "Modeling particle distributions for stray light analysis", Proc. SPIE 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II, 62910T (7 September 2006); https://doi.org/10.1117/12.678321
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Particles

Contamination

Stray light

Picture Archiving and Communication System

Optical fibers

Metals

Communication engineering

Back to Top