Paper
30 March 2004 Quasi-3D modeling, design, and analysis of symmetric on-chip inductors in silicon-on-sapphire technology
Wan-Chul Kong, Said F. Al-Sarawi, Cheng-Chew Lim, Louis Wong
Author Affiliations +
Proceedings Volume 5274, Microelectronics: Design, Technology, and Packaging; (2004) https://doi.org/10.1117/12.522049
Event: Microelectronics, MEMS, and Nanotechnology, 2003, Perth, Australia
Abstract
A design and analysis of symmetric on-chip planar inductors are presented based in 0.5 μm silicon-on-sapphire CMOS process of Peregrine Semiconductor. Compared to conventional CMOS processes, an insulating thick sapphire (Al2O3) substrate enables higher quality factor inductors due to low energy loss in the substrate. In addition, symmetric cross-coupled configuration of identical asymmetric inductors of thick top metalization minimizes the insertion loss. Such differentially connected inductors are simulated on 2.5D electromagnetic field environment and a modeling method of quasi-3D structures is introduced for the metal strips. Maximum quality factor of 53.6 with 2.34 nH at 8.9 GHz is achieved by optimizing the symmetric circular inductors. This inductor is used in the design of a low power (0.42 mW) LC VCO operating at 5.8 GHz and exhibits a phase noise of -120.6 dBc/Hz at 3 MHz offset frequency.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wan-Chul Kong, Said F. Al-Sarawi, Cheng-Chew Lim, and Louis Wong "Quasi-3D modeling, design, and analysis of symmetric on-chip inductors in silicon-on-sapphire technology", Proc. SPIE 5274, Microelectronics: Design, Technology, and Packaging, (30 March 2004); https://doi.org/10.1117/12.522049
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Silicon

Aluminum

Electromagnetism

Metals

Microelectronics

Packaging

Sapphire

Back to Top