Surface contouring using electronic speckle pattern interferometry

David Kerr; Ramon Rodriguez-Vera; Fernando Mendoza Santoyo

doi:10.1117/12.49512

1 December 1991 Surface contouring using electronic speckle pattern interferometry

David Kerr, Ramon Rodriguez-Vera, Fernando Mendoza Santoyo

Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991) https://doi.org/10.1117/12.49512
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Electronic Speckle Pattern Interferometry is used extensively throughout the Engineering sector as an analytical tool. The full potential of the instrument may be realized by the ability to record and shape data without alterations to the optical present here a method of shape measurement which may be optical apparatus identical to conventional out-of-plane instruments. The shape measurement is achieved by small shifts of optical fibres carrying the object and reference beams. We show that the fringe patterns produced are identical to projected fringe contours, and may be analysed in the usual way.

Citation Download Citation

David Kerr, Ramon Rodriguez-Vera, and Fernando Mendoza Santoyo "Surface contouring using electronic speckle pattern interferometry", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.49512

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