Adaptive interferometer measurement of the piezoelectric and electro-optic coefficients of PZT films

Vasilii V. Spirin; Francisco J. Mendieta-Jimenez

doi:10.1117/12.480990

29 August 2002 Adaptive interferometer measurement of the piezoelectric and electro-optic coefficients of PZT films

Vasilii V. Spirin, Francisco J. Mendieta-Jimenez

Proceedings Volume 4905, Materials and Devices for Optical and Wireless Communications; (2002) https://doi.org/10.1117/12.480990
Event: Asia-Pacific Optical and Wireless Communications 2002, 2002, Shanghai, China

Abstract

In this paper we present simple interferometric technique for thin film testing with GaAs:Cr adaptive photodetectors based on the effect of the non-steady-state photoelectromotive force. The technique needs no special vibroinsulation and automatically adjusts and keeps the operation point of the interferometer. Two different interferometric schemes with GaAs:Cr adaptive photodetectors are reported. A modified Mach-Zehnder interferometer with adaptive photodetector is used for the measurement of piezoelectric coefficient of the thin film. A two-beam polarization interferometer with adaptive photodetector is used for the measurement of effective differential Pockels coefficient r_e = r₃₃-(n₀/ne)³r₁₃. It is shown that two-beam polarization technique allows measurement of the Pockels coefficient of thin film with a strong Fabry-Perot effect that usually presents in ferroelectric thin film. Strong hysteresis effect with a slightly asymmetric form of the hysteresis loop was observed at the dependence of d₃₃ and r_e coefficients of the PZT thin film versus DC electric field. The values of d₃₃ and r_e are in agreement with known data.

Citation Download Citation

Vasilii V. Spirin and Francisco J. Mendieta-Jimenez "Adaptive interferometer measurement of the piezoelectric and electro-optic coefficients of PZT films", Proc. SPIE 4905, Materials and Devices for Optical and Wireless Communications, (29 August 2002); https://doi.org/10.1117/12.480990

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