Paper
1 July 1998 Performance of a new Schottky CdTe detector for hard x-ray spectroscopy
Tadayuki Takahashi, Kazuyuki Hirose, Chiho Matsumoto, Kyoko Takizawa, Ryouichi Ohno, Tsutomu Ozaki, Kunishiro Mori, Yasuhiro Tomita
Author Affiliations +
Abstract
We report a significant improvement of the spectral properties of a cadmium telluride (CdTe) detector. With the use of a high quality CdTe crystal, we formed a high Schottky barrier for the holes on a CdTe surface using a low work-function metal, indium. For a 2 X 2 mm2 detector with a thickness of 0.5 mm the leakage current was measured to be 0.7 nA at room temperature (20 degree(s)C) and 10 pA at -20 degree(s)C for a 400 V bias voltage. The low-leakage current of the detector allows us to operate the detector at a higher bias voltage than previous CdTe detectors. The improved charge collection efficiency and the low-leakage current leads to an energy resolution of 1.1 - 2.5 keV FWHM in the energy range 2 keV to 150 keV at 20 degree(s)C without charge loss correction electronics. We confirmed that once a high electric field of several kV/cm is applied, the Schottky CdTe has a very good energy resolution as well as sufficient stability to be used for practical applications.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tadayuki Takahashi, Kazuyuki Hirose, Chiho Matsumoto, Kyoko Takizawa, Ryouichi Ohno, Tsutomu Ozaki, Kunishiro Mori, and Yasuhiro Tomita "Performance of a new Schottky CdTe detector for hard x-ray spectroscopy", Proc. SPIE 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications, (1 July 1998); https://doi.org/10.1117/12.312900
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Cited by 67 scholarly publications.
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KEYWORDS
Sensors

Electrodes

Cadmium

Electrons

Crystals

Hard x-rays

Metals

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