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21 June 2017 Multi-wafer production MBE capabilities for Sb-based type-II SLS IR detectors (Conference Presentation)
Paul R. Pinsukanjana
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Proceedings Volume 10177, Infrared Technology and Applications XLIII; 101770R (2017) https://doi.org/10.1117/12.2266273
Event: SPIE Defense + Security, 2017, Anaheim, CA, United States
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Paul R. Pinsukanjana "Multi-wafer production MBE capabilities for Sb-based type-II SLS IR detectors (Conference Presentation)", Proc. SPIE 10177, Infrared Technology and Applications XLIII, 101770R (21 June 2017); https://doi.org/10.1117/12.2266273
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KEYWORDS
Infrared detectors
Laser sintering
Cryogenics
Current controlled current source
Epitaxy
Infrared technology
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