TlBa2Ca2Cu3O9 film for detection of visible and far-infrared radiation

Rainer S. Nebosis; M. A. Heusinger; Wolfgang Schatz; A. Piehler; R. Loew; N. Reschauer; Karl F. Renk; Alex D. Semenov; Pavel B. Kouminov; Ivane G. Goghidze; Eugeni M. Gershenzon

doi:10.1117/12.176132

20 May 1994 TlBa₂Ca₂Cu₃O₉ film for detection of visible and far-infrared radiation

Rainer S. Nebosis, M. A. Heusinger, Wolfgang Schatz, A. Piehler, R. Loew, N. Reschauer, Karl F. Renk, Alex D. Semenov, Pavel B. Kouminov, Ivane G. Goghidze, Eugeni M. Gershenzon

Author Affiliations +

Proceedings Volume 2159, High-Temperature Superconducting Detectors: Bolometric and Nonbolometric; (1994) https://doi.org/10.1117/12.176132
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

Fast resistive response of structured TiBa₂Ca₂Cu₃O₉ thin film to visible and far-infrared pulsed radiation has been observed for the first time. The voltage response of a current biased film was induced by a Nd:YAG laser in the visible and by an optically pumped Raman laser in the far-infrared range. Fast components of the response with a duration limited by the temporal resolution of the readout systems were observed in both spectral ranges. Each signal pulse consisted of a fast component that was followed by a slower decaying signal. We attributed the slow decay, with a time constant of few ns, to bolometric effects. The fast component of the response was most likely due to the depression of superconductivity by light induced nonequilibrium quasiparticles. The high temporal resolution, a large range of responsivity of few mV/W of the structured film represent a very powerful detector performance.

Citation Download Citation

Rainer S. Nebosis, M. A. Heusinger, Wolfgang Schatz, A. Piehler, R. Loew, N. Reschauer, Karl F. Renk, Alex D. Semenov, Pavel B. Kouminov, Ivane G. Goghidze, and Eugeni M. Gershenzon "TlBa₂Ca₂Cu₃O₉ film for detection of visible and far-infrared radiation", Proc. SPIE 2159, High-Temperature Superconducting Detectors: Bolometric and Nonbolometric, (20 May 1994); https://doi.org/10.1117/12.176132

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