Wavelength scaling investigation of several materials

John C. Stover; Marvin L. Bernt; Charles M. Egert

doi:10.1117/12.162654

1 December 1993 Wavelength scaling investigation of several materials

John C. Stover, Marvin L. Bernt, Charles M. Egert

Proceedings Volume 1995, Optical Scattering: Applications, Measurement, and Theory II; (1993) https://doi.org/10.1117/12.162654
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

A logical approach to investigating materials that scatter non-topographically is to coat them with a thin layer that scatters only topographically (i.e., a layer that wavelength scales) so that the two scatter sources can be separated. This technique has been used to study scatter from beryllium mirrors using layers of aluminum and gold. In the course of these investigations it was learned that many aluminum surfaces do not wavelength scale (no information was available on gold). This was discovered fairly late in the study and caused a lot of extra expense and frustration. This paper presents wavelength scaling data from the uv to the mid-IR for several materials. The intention is to provide guidance for future studies of this nature.

Citation Download Citation

John C. Stover, Marvin L. Bernt, and Charles M. Egert "Wavelength scaling investigation of several materials", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162654

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