Direct determination of carrier mobilities of OLED materials by admittance spectroscopy

S. W. Tsang; K. L. Tong; S. C. Tse; S. K. So

doi:10.1117/12.682341

5 December 2006 Direct determination of carrier mobilities of OLED materials by admittance spectroscopy

S. W. Tsang, K. L. Tong, S. C. Tse, S. K. So

Proceedings Volume 6333, Organic Light Emitting Materials and Devices X; 633313 (2006) https://doi.org/10.1117/12.682341
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

We show that admittance spectroscopy (AS) can be used to determine charge carrier mobilities and transport parameters in materials relevant to organic light-emitting diodes (OLEDs). Via computer simulation, we found that a plot of the negative differential susceptance vs frequency yields a maximum at a frequency τ_r^-1. The position of the maximum τ_r^-1 is related to the average carrier transit time τ_dc by τ_dc = 0.56 τ_r. Thus knowledge of τ_r can be used to determine the carrier mobility in the material. Devices with the structure anode/phenylamines/Ag have been designed to evaluate their mobilities. The extracted hole mobility data from AS in pristine and doped material systems are in excellent agreement with those independently extracted from time-of-flight (TOF) technique. In addition, materials with different energy levels of highest occupied molecular orbital (HOMO), are further examined in order to study the effects of injection barrier on the extracted mobility by AS. In the case of an Ohmic hole contact (e.g. ITO or Au /m-MTDATA), the mobility data is good agreement with TOF results. However, for a non-Ohmic contact, the extracted mobility appears to be smaller. Thus AS can be used a means of evaluating the quality of electric contact between the injection electrode and the organic material.

Citation Download Citation

S. W. Tsang, K. L. Tong, S. C. Tse, and S. K. So "Direct determination of carrier mobilities of OLED materials by admittance spectroscopy", Proc. SPIE 6333, Organic Light Emitting Materials and Devices X, 633313 (5 December 2006); https://doi.org/10.1117/12.682341

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