Paper
11 December 2002 Morphology and optical properties of discontinuous gold films on semiconductor surface
Tetyana R. Barlas, Nikolas L. Dmitruk, Volodymyr R. Romaniuk
Author Affiliations +
Proceedings Volume 4938, Selected Papers from the International Conference on Spectroscopy of Molecules and Crystals; (2002) https://doi.org/10.1117/12.486675
Event: XV International School on Spectroscopy of Molecules and Crystals, 2001, Chernivsti, Ukraine
Abstract
This paper is devoted to investigations of discontinuous metal films on semicondcutor surface by transmission electron microscopy (TEM) and atomic force microscopy (AFM). Technology of local electrochemical deposition of noble metal nanoparticles on semiconductor substrate is elaborated. It allows to obtain as well isolated Au particles with the 2-50 nm diameter as some chain structures perhaps of fractal type. According to the TEM and AFM data the gold clusters have the form of a truncated spheres surrounded by uncovered microrelief areas of semiconductor. Comparison of these two methods allows to study the morphology of metal coating, and the shape of metal islands, and their sizes. The microrelief of substrate surface, inevitable at used technology of the gold preparation, has been identified. In order to study the effect of both gold island and surface roughness on the optical properties of structures, we performed the reflectance spectra of polarized light measurements at several angles of incidence. Optical reflectance spectra are interpreted by the modified Maxwell-Garnett theory taking into account the pair multipole interaction between the nanoparticles or by the symmetrical Bruggeman's approximation.
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Tetyana R. Barlas, Nikolas L. Dmitruk, and Volodymyr R. Romaniuk "Morphology and optical properties of discontinuous gold films on semiconductor surface", Proc. SPIE 4938, Selected Papers from the International Conference on Spectroscopy of Molecules and Crystals, (11 December 2002); https://doi.org/10.1117/12.486675
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Cited by 4 scholarly publications.
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KEYWORDS
Gold

Metals

Atomic force microscopy

Gallium arsenide

Semiconductors

Reflectivity

Transmission electron microscopy

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