1 June 1993 Additive/subtractive decorrelated electronic speckle pattern interferometry
Bruno F. Pouet, Sridhar Krishnaswamy
Author Affiliations +
Abstract
A hybrid additive-subtractive decorrelated electronic speckle pattern interferometry (ESPI) scheme using a continuous reference updating technique is presented. Unlike conventional ESPI techniques, this method uses speckle phase decorrelation between successively subtracted additive correlated speckle images, each of which contains information about the same two states of deformation of a test object undergoing vibrational stressing. It is shown that the susceptibility of this method to environmental noise caused by building vibrations or air currents is significantly lower than that of conventional subtractive ESPI methods, and fringe visibility and contrast are significantly improved over conventional additive ESPI techniques. The ability of this technique to work in a turbulent environment is demonstrated, and application to detection of defects in adhesively bonded structures, a problem of interest to the nondestructive evaluation (NDE) community, is shown.
Bruno F. Pouet and Sridhar Krishnaswamy "Additive/subtractive decorrelated electronic speckle pattern interferometry," Optical Engineering 32(6), (1 June 1993). https://doi.org/10.1117/12.135841
Published: 1 June 1993
Lens.org Logo
CITATIONS
Cited by 26 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle

Speckle pattern

Fringe analysis

Acoustics

Image processing

Nondestructive evaluation

Interferometry

Back to Top