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Cu3Sn-microporous copper composite joint for high-temperature die-attach applications

Zhen Pan (The School of Material Science and Chemical Engineering, Harbin University of Science and Technology, Harbin, China)
Fenglian Sun (Harbin University of Science and Technology, Harbin, China)

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 4 October 2021

Issue publication date: 12 April 2022

109

Abstract

Purpose

The purpose of this paper is to design a novel die-attach composite joint for high-temperature die-attach applications based on transient liquid phase bonding. Moreover, the microstructure, shear strength, electrical property, thermal conductivity and aging property of the composite joint were investigated.

Design/methodology/approach

The composite joint was made of microporous copper and Cu3Sn. Microporous copper was immersed into liquid Sn to achieve Sn-microporous copper composite structure for die attachment. By the thermo-compression bonding, the Cu3Sn-microporous copper composite joint with a thickness of 100 µm was successfully obtained after bonding at 350 °C for 5 min under a low pressure of 0.6 MPa.

Findings

After thermo-compression bonding, the resulting interconnection could withstand a high temperature of at most 676 °C, with the entire Sn transforming into Cu3Sn with high remelting temperatures. A large shear strength could be achieved with the Cu3Sn-microporous copper in the interconnections. The formed bondlines demonstrated a good electrical and thermal conductivity owing to the large existing amount of copper in the interconnections. Furthermore, the interconnection also exhibited excellent reliability under high temperature aging at 300 °C.

Originality/value

This die-attach composite joint was suitable for power devices operating under high temperatures or other harsh environments.

Keywords

Citation

Pan, Z. and Sun, F. (2022), "Cu3Sn-microporous copper composite joint for high-temperature die-attach applications", Soldering & Surface Mount Technology, Vol. 34 No. 3, pp. 137-144. https://doi.org/10.1108/SSMT-07-2021-0047

Publisher

:

Emerald Publishing Limited

Copyright © 2020, Emerald Publishing Limited

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