INVERSE MODELLING OF AMORPHOUS SILICON SOLAR CELL TIME‐OF‐FLIGHT TRANSIENTS
ISSN: 0332-1649
Article publication date: 1 April 1991
Abstract
For the extraction of transport parameters from Time‐of‐Flight (TOF) measurements a simulation and optimization program was developed that uses the principle of Inverse Modelling. The model describing the physical transport processes in an amorphous device is discussed as well as the implementation of the simulator in the dataprocessor and optimization driver PROFILE. As an example a simulation of TOF measurements at an amorphous p‐i‐n solar cell is shown.
Citation
Buykx, A.A., Wentinck, H.M., Crans, W. and Metselaar, J.W. (1991), "INVERSE MODELLING OF AMORPHOUS SILICON SOLAR CELL TIME‐OF‐FLIGHT TRANSIENTS", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 10 No. 4, pp. 589-598. https://doi.org/10.1108/eb051733
Publisher
:MCB UP Ltd
Copyright © 1991, MCB UP Limited