Synchrotron radiation - its application to high-speed, high-resolution X-ray diffraction topography

With almost perfect silicon crystals and cleaved lithium fluoride crystals as extreme examples, the feasibility of using synchrotron radiation for X-ray diffraction topography has been investigated. In both spatial resolution and strain resolution the synchrotron source diffraction topographs are competitive with topographs obtained using conventional X-ray sources but exposure times are reduced from several hours per cm² to one second per cm² using standard recording techniques with Ilford nuclear emulsions. Contrary to (the author's) expectations, the instrumentation required is far simpler for synchrotron radiation than for conventional sources.