X-Ray Photoemission Spectra of Crystalline and Amorphous Si and Ge Valence Bands

L. Ley, S. Kowalczyk, R. Pollak, and D. A. Shirley
Phys. Rev. Lett. 29, 1088 – Published 16 October 1972
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Abstract

High-resolution x-ray photoelectron spectra of the total valence bands of crystalline and amorphous silicon and germanium are reported. For the crystals, the spectra yield results that are strikingly similar to current theoretical calculations of the electron density of states, ρ(E). Amorphous Si and Ge exhibit definite band structures that are similar to one another but markedly different from the crystalline results. They agree very well with the theoretical model of Joannopoulos and Cohen.

  • Received 13 July 1972

DOI:https://doi.org/10.1103/PhysRevLett.29.1088

©1972 American Physical Society

Authors & Affiliations

L. Ley*, S. Kowalczyk, R. Pollak, and D. A. Shirley

  • Department of Chemistry and Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720

  • *On leave from University of Bonn, Bonn, Germany.
  • In partial fulfillment of Ph. D.

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Vol. 29, Iss. 16 — 16 October 1972

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