Reconstruction of the electric field in type-II superconducting thin films in perpendicular geometry

C. Romero-Salazar, Ch. Jooss, and O. A. Hernández-Flores
Phys. Rev. B 81, 144506 – Published 15 April 2010

Abstract

The study of electric field distributions induced by flux creep in type-II superconducting films allows for important insight into the mechanism of vortex dynamics, the temporal evolution of flux and current distributions, and the occurrence of local losses. Most studies are based on the assumption that a phenomenological materials law, which has been extracted from macroscopic transport measurements, can be also applied to the local electric field during magnetization decay. We evaluate this ansatz by reconstructing the three-dimensional-induced Ei and potential Ep electric fields from experimentally measured time dependence of the flux density distribution. The results are quantitatively compared with solutions of the nonlinear and nonlocal equation of motion for the flux penetration, where the Maxwell equations as well as a materials law are utilized to obtain a two-dimensional Ei,2D and Ep,2D. We focus our analysis on the electric field distributions on a partially penetrated magnetized state of an epitaxial YBa2Cu3O6.95 film.

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  • Received 24 November 2009

DOI:https://doi.org/10.1103/PhysRevB.81.144506

©2010 American Physical Society

Authors & Affiliations

C. Romero-Salazar* and Ch. Jooss

  • Institut für Materialphysik, Friedrich Hund Platz 1, 37077 Göttingen, Germany

O. A. Hernández-Flores

  • Escuela de Ciencias, Universidad Autónoma “Benito Juárez” de Oaxaca, Av. Universidad s/n, Ex Hacienda Cinco Señores, Oaxaca de Juárez, Oaxaca CP 68120 México

  • *Current address: Escuela de Ciencias, Universidad Autónoma “Benito Juárez” de Oaxaca, Av. Universidad s/n, Ex Hacienda Cinco Señores, Oaxaca de Juárez, Oaxaca CP 68120 México.
  • Author to whom correspondence should be addressed; jooss@ump.gwdg.de

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Issue

Vol. 81, Iss. 14 — 1 April 2010

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