Interlayer and interfacial exchange coupling in ferromagnetic metal/semiconductor heterostructures

M. J. Wilson, M. Zhu, R. C. Myers, D. D. Awschalom, P. Schiffer, and N. Samarth
Phys. Rev. B 81, 045319 – Published 25 January 2010

Abstract

We describe a systematic study of the exchange coupling between a magnetically hard metallic ferromagnet (MnAs) and a magnetically soft ferromagnetic semiconductor (Ga1xMnxAs) in bilayer and trilayer heterostructures. An exchange spring model of MnAs/Ga1xMnxAs bilayers accounts for the variation in the exchange-bias field with layer thickness and composition. We also present evidence for hole-mediated interlayer exchange coupling in MnAs/p-GaAs/Ga1xMnxAs trilayers and study the dependence of the exchange-bias field on the thickness of the spacer layer.

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  • Received 21 May 2009

DOI:https://doi.org/10.1103/PhysRevB.81.045319

©2010 American Physical Society

Authors & Affiliations

M. J. Wilson1, M. Zhu1, R. C. Myers2, D. D. Awschalom2, P. Schiffer1, and N. Samarth1,*

  • 1Department of Physics, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
  • 2Department of Physics, University of California, Santa Barbara, California 93106, USA

  • *nsamarth@psu.edu

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Vol. 81, Iss. 4 — 15 January 2010

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