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Nonactivated transport of strongly interacting two-dimensional holes in GaAs

Jian Huang, D. S. Novikov, D. C. Tsui, L. N. Pfeiffer, and K. W. West
Phys. Rev. B 74, 201302(R) – Published 9 November 2006

Abstract

We report on the transport measurements of two-dimensional holes in GaAs field-effect transistors with record low densities down to 7×108cm2. Remarkably, such a dilute system (with Fermi wavelength approaching 1μm) exhibits a nonactivated conductivity that grows with temperature approximately as a power law at sufficiently low temperatures. We contrast it with the activated transport found in more disordered samples and discuss possible transport mechanisms in this strongly interacting regime.

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  • Received 8 September 2006

DOI:https://doi.org/10.1103/PhysRevB.74.201302

©2006 American Physical Society

Authors & Affiliations

Jian Huang1, D. S. Novikov1, D. C. Tsui1, L. N. Pfeiffer2, and K. W. West2

  • 1Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA
  • 2Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974, USA

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Issue

Vol. 74, Iss. 20 — 15 November 2006

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