Far-field subdiffraction optical microscopy using metamaterial crystals: Theory and simulations

Alessandro Salandrino and Nader Engheta
Phys. Rev. B 74, 075103 – Published 15 August 2006

Abstract

Here we suggest and explore theoretically an idea for a far-field scanless optical microscopy with a subdiffraction resolution. We exploit the special dispersion characteristics of an anisotropic metamaterial crystal that is obliquely cut at its output plane, or has a curved output surface, in order to map the input field distribution onto the crystal’s output surface with a compressed angular spectrum, resulting in a “magnified” image. This can provide a far-field imaging system with a resolution beyond the diffraction limits while no scanning is needed.

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  • Received 26 May 2006

DOI:https://doi.org/10.1103/PhysRevB.74.075103

©2006 American Physical Society

Authors & Affiliations

Alessandro Salandrino and Nader Engheta*

  • Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA

  • *To whom correspondence should be addressed. Email address: engheta@ee.upenn.edu

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Issue

Vol. 74, Iss. 7 — 15 August 2006

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