Mechanism for epitaxial breakdown during low-temperature Ge(001) molecular beam epitaxy

K. A. Bratland, Y. L. Foo, J. A. N. T. Soares, T. Spila, P. Desjardins, and J. E. Greene
Phys. Rev. B 67, 125322 – Published 31 March 2003
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Abstract

A combination of in situ and post-deposition experiments were designed to probe surface roughening pathways leading to epitaxial breakdown during low-temperature (Ts=95190°C) growth of Ge(001) by molecular beam epitaxy (MBE). We demonstrate that epitaxial breakdown in these experiments is not controlled by background hydrogen adsorption or gradual defect accumulation as previously suggested, but is a growth-mode transition driven by kinetic surface roughening. Ge(001) layers grown at Ts170°C remain fully epitaxial to thicknesses h>1.6 μm, while deposition at Ts<170°C leads to a locally abrupt transition from epitaxial to amorphous growth at critical film thicknesses h2(Ts). Surface morphology during low-temperature Ge(001) MBE evolves via the formation of a periodic array of self-organized round growth mounds which, for deposition at Ts>115°C, transform to a pyramidal shape with square bases having edges aligned along 〈100〉 directions. Surface widths w and in-plane coherence lengths d increase monotonically with film thickness h at a temperature-dependent rate. As hh1(Ts), defined as the onset of epitaxial breakdown, deep cusps bounded by {111} facets form at the base of interisland trenches and we show that epitaxial breakdown is initiated on these facets as the surface roughness reaches a critical Ts-independent aspect ratio w/d0.02. h1(Ts) and h2(Ts) follow relationships h1(2)exp(E1(2)/kTs), where E1 is 0.61 eV and E2=0.48 eV. E1 is approximately equal to the Ge adatom diffusion barrier on Ge(001) while (E1E2)=0.13 eV is the free energy difference between crystalline and amorphous Ge. We summarize our results in a microstructural phase map vs Ts and h, and propose an atomistic growth model to explain the epitaxial to amorphous phase transition.

  • Received 10 October 2002

DOI:https://doi.org/10.1103/PhysRevB.67.125322

©2003 American Physical Society

Authors & Affiliations

K. A. Bratland, Y. L. Foo, J. A. N. T. Soares, T. Spila, P. Desjardins*, and J. E. Greene

  • Materials Science Department and the Frederick Seitz Materials Research Laboratory, University of Illinois, 104 South Goodwin Avenue, Urbana, Illinois 61801

  • *Also at: Département de génie physique, École Polytechnique de Montréal, C.P. 6079, Succ. Centre-Ville, Montréal, Québec H3C 3A7 Canada.

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Vol. 67, Iss. 12 — 15 March 2003

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