Atomic-resolution annular dark-field STEM image calculations

K. Watanabe; T. Yamazaki; I. Hashimoto; M. Shiojiri

doi:10.1103/PhysRevB.64.115432

Atomic-resolution annular dark-field STEM image calculations

K. Watanabe, T. Yamazaki, I. Hashimoto, and M. Shiojiri

Phys. Rev. B 64, 115432 – Published 31 August 2001

Abstract

A method based on the three-dimensional Bloch wave description has been developed for the simulation of atomic-resolution annular dark-field (ADF) scanning transmission electron microscopy (STEM) images, which includes the coherent Bragg reflection and the incoherent thermal diffuse scattering (TDS). The contribution of TDS is estimated using two kinds of optical potentials. The validity and accuracy of the method are demonstrated by comparisons in focus dependence between experimental and calculated high-angle (HA) ADF STEM images and in thickness dependence between experimental and calculated ADF STEM intensities. The method reduces the computing time for a HAADF STEM image calculation to about one-tenth of that required for the usual three-dimensional Bloch wave method.

Received 9 November 2000

DOI:https://doi.org/10.1103/PhysRevB.64.115432

Authors & Affiliations

K. Watanabe¹, T. Yamazaki², I. Hashimoto², and M. Shiojiri^3,4

¹Tokyo Metropolitan College of Technology, 1-10-40 Higashiohi, Tokyo 140-0011, Japan
²Department of Physics, Science University of Tokyo, Tokyo 162-8601, Japan
³Department of Anatomy, Kanazawa Medical University, Ishikawa 920-0293, Japan
⁴Kyoto Institute of Technology, Kyoto 606-8585, Japan

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Vol. 64, Iss. 11 — 15 September 2001

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Physical Review B

covering condensed matter and materials physics