We have studied individual latent tracks induced by 500-MeV Xe ions in muscovite mica by scanning force microscopy (SFM) and lateral force microscopy (LFM) as a function of the applied loading force $F_n$. It was found that the observed contrast as well as the apparent diameter of the latent ion tracks as imaged by SFM and LFM depends critically on $F_n$. Good agreement with small-angle x-ray-diffraction data is obtained only in the limit of zero applied load.

• Received 15 April 1996

DOI:https://doi.org/10.1103/PhysRevB.53.R16180