Raman scattering from ion-implanted graphite

B. S. Elman, M. S. Dresselhaus, G. Dresselhaus, E. W. Maby, and H. Mazurek
Phys. Rev. B 24, 1027 – Published 15 July 1981; Erratum Phys. Rev. B 26, 3474 (1982)
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Abstract

Ion-implanted graphite is studied by Raman scattering. Highly oriented pyrolytic graphite is implanted with Li7, Be9, B11, C12, P31, and As75 ions at 100 keV normally incident upon the c face. Ion fluences in the range 1 × 1014 to 2.5 × 1016 ions/cm2 are used. The lattice damage upon implantation is monitored by observation of the disorder-induced Raman line at ∼ 1355 cm1 in the first-order spectra and at ∼ 2970 cm1 in the second-order spectra. The Raman results indicate that an abrupt transformation to an amorphous surface layer occurs at a critical fluence which varies with the mass of the implanted ion. Results for first- and second-order Raman spectra are also presented for the same ion-implanted samples upon isochronal vacuum annealing at various annealing temperatures, showing a partial restoration of the graphite ordering. The second-order Raman spectra are even more sensitive than the first-order spectra to the creation of lattice damage by ion implantation and to the subsequent partial restoration of lattice order by annealing.

  • Received 8 December 1980

DOI:https://doi.org/10.1103/PhysRevB.24.1027

©1981 American Physical Society

Erratum

Erratum: Raman scattering from ion-implanted graphite

B. S. Elman, M. S. Dresselhaus, G. Dresselhaus, E. W. Maby, and H. Mazurek
Phys. Rev. B 26, 3474 (1982)

Authors & Affiliations

B. S. Elman

  • Center for Materials Science and Engineering and the Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

M. S. Dresselhaus

  • Center for Materials Science and Engineering and the Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

G. Dresselhaus

  • Francis Bitter National Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

E. W. Maby

  • Center for Materials Science and Engineering and the Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

H. Mazurek

  • Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

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Issue

Vol. 24, Iss. 2 — 15 July 1981

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